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Journal of Electronic Materials

Ausgabe 2/2009

Inhalt (21 Artikel)

Foreword

Fu Guo, Carol A. Handwerker, Srinivas Chada, Fay Hua, Kejun Zeng

The Influence of an Imposed Current on the Creep of Sn-Ag-Cu Solder

Christopher Kinney, J.W. Morris Jr., Tae-Kyu Lee, Kuo-Chuan Liu, Jie Xue, Dave Towne

Interfacial Reaction and Die Attach Properties of Zn-Sn High-Temperature Solders

Seongjun Kim, Keun-Soo Kim, Sun-Sik Kim, Katsuaki Suganuma

Microstructure, Defects, and Reliability of Mixed Pb-Free/Sn-Pb Assemblies

Polina Snugovsky, Heather McCormick, Simin Bagheri, Zohreh Bagheri, Craig Hamilton, Marianne Romansky

Stability of Flip-Chip Interconnects Assembled with Al/Ni(V)/Cu-UBM and Eutectic Pb-Sn Solder During Exposure to High-Temperature Storage

J. Osenbach, A. Amin, M. Bachman, F. Baiocchi, D. Bitting, D. Crouthamel, J. DeLucca, D. Gerlach, J. Goodell, C. Peridier, M. Stahley, R. Weachock

Nature of Growth Pits in Lead Salt Epilayers Grown by Molecular Beam Epitaxy

Jiangang Ma, Donghui Li, Gang Bi, Fanghai Zhao, Shelly Elizondo, Shaibal Mukherjee, Zhisheng Shi

Effects of Thermal Aging on Microstructure and Microhardness of Sn-3.7Ag-0.9Zn-1In Solder

Chen Wei, Yongchang Liu, Zhiming Gao, Jingbo Wan, Changsheng Ma

Nanoparticles of the Lead-free Solder Alloy Sn-3.0Ag-0.5Cu with Large Melting Temperature Depression

Chang Dong Zou, Yu Lai Gao, Bin Yang, Xin Zhi Xia, Qi Jie Zhai, Cristina Andersson, Johan Liu

Study of Low-Temperature Thermocompression Bonding in Ag-In Solder for Packaging Applications

Riko I Made, Chee Lip Gan, Li Ling Yan, Aibin Yu, Seung Wook Yoon, John H. Lau, Chengkuo Lee

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