Ausgabe 1/2011
Inhalt (11 Artikel)
Experimental Results for Slow-speed Timing Characterization of High-speed Pipelined Datapaths
Muhammad Nummer, Manoj Sachdev
A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment
Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner
Masking of X-Values by Use of a Hierarchically Configurable Register
Thomas Rabenalt, Michael Goessel, Andreas Leininger
Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping
Bin Zhou, Li-yi Xiao, Yi-Zheng Ye, Xin-Chun Wu
Test Strategies for Electrode Degradation in Bio-Fluidic Microsystems
Qais Al-Gayem, Hongyuan Liu, Andrew Richardson, Nick Burd
Fault Diagnosis in Lab-on-Chip Using Digital Microfluidic Logic Gates
Yang Zhao, Krishnendu Chakrabarty
A Design of Linearity Built-in Self-Test for Current-Steering DAC
Hsin-Wen Ting, Soon-Jyh Chang, Su-Ling Huang