Journal of Electronic Testing

Editorial

Vishwani D. Agrawal

New Editors, 2013

2012 JETTA Reviewers

Test Technology Newsletter

Evaluating Different Strategies for Testing Software Product Lines

Thelma Elita Colanzi, Wesley Klewerton Guez Assunção, Daniela de Freitas Guilhermino Trindade, Carlos Alberto Zorzo, Silvia Regina Vergilio

Applying Petri Nets to Modeling of Many-Core Processor Self-Testing when Tests are Performed Randomly

Viktor Mashkov, Jiri Barilla, Pavel Simr

Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults

Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor

Testing of Synchronizers in Asynchronous FIFO

Hyoung-Kook Kim, Laung-Terng Wang, Yu-Liang Wu, Wen-Ben Jone

Reconfigurable Concurrent Error Detection Adaptive to Dynamicity of Power Constraints

Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu

SEU Fault-Injection in VHDL-Based Processors: A Case Study

Wassim Mansour, Raoul Velazco

A New Analog Circuit Fault Diagnosis Method Based on Improved Mahalanobis Distance

Han Han, Houjun Wang, Shulin Tian, Na Zhang

Eliminating the Timing Penalty of Scan

Ozgur Sinanoglu, Vishwani D. Agrawal

Analog Circuits Fault Detection Using Cross-Entropy Approach

Xifeng Li, Yongle Xie