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Zeitschrift

Journal of Electronic Testing

Journal of Electronic Testing 1/2020

Ausgabe 1/2020

Inhaltsverzeichnis ( 14 Artikel )

30.01.2020 | Ausgabe 1/2020

Editorial

Vishwani D. Agrawal

08.02.2020 | Ausgabe 1/2020

New Editor – 2020

31.01.2020 | Ausgabe 1/2020

2019 Reviewers

05.02.2020 | Ausgabe 1/2020

Test Technology Newsletter February 2020

23.01.2020 | Ausgabe 1/2020

Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated Components

Seyed Mostafa Banitaba, Roya M. Ahari, Mahdi Karbasian

07.02.2020 | Ausgabe 1/2020

Trojan Detection Test for Clockless Circuits

Ricardo Aquino Guazzelli, Matheus Garay Trindade, Leonel Acunha Guimarães, Thiago Ferreira de Paiva Leite, Laurent Fesquet, Rodrigo Possamai Bastos

23.01.2020 | Ausgabe 1/2020

On Using Approximate Computing to Build an Error Detection Scheme for Arithmetic Circuits

B. Deveautour, A. Virazel, P. Girard, V. Gherman

19.12.2019 | Ausgabe 1/2020

Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems

Alejandro Serrano-Cases, Felipe Restrepo-Calle, Sergio Cuenca-Asensi, Antonio Martínez-Álvarez

18.02.2020 | Ausgabe 1/2020

Modeling Remapping Based Fault Tolerance Techniques for Chip Multiprocessor Cache with Design Space Exploration

Avishek Choudhury, Biplab K. Sikdar

28.01.2020 | Ausgabe 1/2020

Optimal Selection of Tests for Fault Diagnosis in Multi-Path System with Time-delay

Zhexi Yao, Lingchao Zhu, Tao Zhang, Jinbo Wang

20.03.2020 | Ausgabe 1/2020

High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors

Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik

04.02.2020 | Ausgabe 1/2020

An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits

Mousum Handique, Jantindra Kumar Deka, Santosh Biswas

03.02.2020 | Ausgabe 1/2020

Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures

Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal

10.01.2020 | Manuscript | Ausgabe 1/2020

An Efficient Accuracy Reconfigurable CLA Adder Designs Using Complementary Logic

Sujit Kumar Patel, Bharat Garg, Shireesh Kumar Rai

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