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Zeitschrift

Journal of Electronic Testing

Journal of Electronic Testing 1/2021

Ausgabe 1/2021

Inhaltsverzeichnis ( 13 Artikel )

15.02.2021 | Ausgabe 1/2021

Editorial

Vishwani D. Agrawal

31.03.2021 | Ausgabe 1/2021

2020 JETTA Reviewers

13.03.2021 | Ausgabe 1/2021

Test Technology Newsletter

23.02.2021 | Ausgabe 1/2021

Pre-Silicon Verification Using Multi-FPGA Platforms: A Review

Umer Farooq, Habib Mehrez

07.06.2021 | Ausgabe 1/2021

Estimating Operational Age of an Integrated Circuit

Prattay Chowdhury, Ujjwal Guin, Adit D. Singh, Vishwani D. Agrawal

24.05.2021 | Ausgabe 1/2021

High Resolution Pulse Propagation Driven Trojan Detection in Digital Systems

Sabyasachi Deyati, Barry J. Muldrey, Adit D. Singh, Abhijit Chatterjee

30.03.2021 | Ausgabe 1/2021

Aging Prediction and Tolerance for the SRAM Memory Cell and Sense Amplifier

Helen-Maria Dounavi, Yiorgos Sfikas, Yiorgos Tsiatouhas

27.01.2021 | Ausgabe 1/2021

Fault Diagnosis of Linear Analog Electronic Circuit Based on Natural Response Specification using K-NN Algorithm

Karthik Pandaram, S. Rathnapriya, V. Manikandan

28.01.2021 | Ausgabe 1/2021

On-Line Test of Pin-Constrained Digital Microfluidic Biochips with Connect-5 Structure

Xijun Huang, Chuanpei Xu, Long Zhang

24.04.2021 | Ausgabe 1/2021

Testing and Diagnosis of Digital Microfluidic Biochips using Multiple Droplets

Sourav Ghosh, Surajit Kumar Roy, Chandan Giri

06.05.2021 | Ausgabe 1/2021

Single Particle Fault Injection Signal Generation Method Using Gaussian Cloud Model

Mengru Wang, Jinbo Wang, Jianmin Wang, Shan Zhou

01.02.2021 | Ausgabe 1/2021

Model Transferability from ImageNet to Lithography Hotspot Detection

Yindong Xiao, Xueqian Huang, Ke Liu

02.03.2021 | Ausgabe 1/2021

Decoupling Capacitor Estimation and Allocation using Optimization Techniques for Power Supply Noise Reduction in System-on-Chip

Partha Mitra, Jaydeb Bhaumik, Angsuman Sarkar

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