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Journal of Electronic Testing 1/2022
Journal of Electronic Testing

Ausgabe 1/2022

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Inhaltsverzeichnis (11 Artikel)

14.03.2022

Editorial
Vishwani D. Agrawal

19.03.2022

New Editors – 2022

14.03.2022

2021 Reviewers

22.03.2022

Test Technology Newsletter

14.03.2022

Hardware Obfuscation for IP Protection of DSP Applications
Naveenkumar R, N.M. Sivamangai, Napolean A, G. Akashraj Nissi

09.03.2022

Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies
Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, Kazumi Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa

25.03.2022

Synthesis of Reversible Circuits with Reduced Nearest-Neighbor Cost Using Kronecker Functional Decision Diagrams
Dengli Bu, Junjie Yan, Pengjie Tang, Haohao Yuan

09.04.2022

A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design
Yingchun Lu, Guangzhen Hu, Jianan Wang, Hao Wang, Liang Yao, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang

08.03.2022

A New Neural Network Based on CNN for EMIS Identification
Ying-chun Xiao, Feng Zhu, Sheng-xian Zhuang, Yang Yang

04.04.2022

Design of Power Gated SRAM Cell for Reducing the NBTI Effect and Leakage Power Dissipation During the Hold Operation
Abhishek Bhattacharjee, Abhishek Nag, Kaushik Das, Sambhu Nath Pradhan

10.03.2022

A Low-cost BIST Design Supporting Offline and Online Tests
Ahmad Menbari, Hadi Jahanirad

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