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Journal of Electronic Testing

Ausgabe 2/2013

Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN)

Inhalt (14 Artikel)

Editorial

Vishwani D. Agrawal

Guest Editorial

Dimitris Gizopoulos, Said Hamdioui, Hans Manhaeve

On the Simulation of HCI-Induced Variations of IC Timings at High Level

Olivier Heron, Clement Bertolini, Chiara Sandionigi, Nicolas Ventroux, Francois Marc

CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis

Liang Chen, Mojtaba Ebrahimi, Mehdi B. Tahoori

Self-Adaptive Fault Tolerance in Multi-/Many-Core Systems

Cristiana Bolchini, Matteo Carminati, Antonio Miele

Circuit Level Concurrent Error Detection in FSMs

Natalja Kehl, Wolfgang Rosenstiel

Secure JTAG Implementation Using Schnorr Protocol

Amitabh Das, Jean Da Rolt, Santosh Ghosh, Stefaan Seys, Sophie Dupuis, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede

Novel Self-Timed, Pipelined Clock Scan Architecture

Kanad Chakraborty, James E. Kelly, Brian P. Evans

A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients

Zhichao Zhang, Yi Ren, Li Chen, Nelson J. Gaspard, Arthur. F. Witulski, Timothy W. Holman, Bharat L. Bhuva, Shi-Jie Wen, Ramaswami Sammynaiken

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