Ausgabe 2/2015
Inhalt (10 Artikel)
Digital Calibration for 8-bit Delay Line ADC Using Harmonic Distortion Correction
Hsun-Cheng Lee, Jacob A. Abraham
Application-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors
Felipe Restrepo-Calle, Sergio Cuenca-Asensi, Antonio Martínez-Álvarez, Eduardo Chielle, Fernanda Lima Kastensmidt
Scalable and Optimized Hybrid Verification of Embedded Software
Jörg Behrend, Djones Lettnin, Alexander Grünhage, Jürgen Ruf, Thomas Kropf, Wolfgang Rosenstiel
Reusing RTL Assertion Checkers for Verification of SystemC TLM Models
Nicola Bombieri, Franco Fummi, Valerio Guarnieri, Graziano Pravadelli, Francesco Stefanni, Tara Ghasempouri, Michele Lora, Giovanni Auditore, Mirella Negro Marcigaglia
A Determinate Radiation Hardened Technique for Safety-Critical CMOS Designs
Ryan H.-M. Huang, Dennis K.-H. Hsu, Charles H.-P. Wen
Formal Quantification of the Register Vulnerabilities to Soft Error in RTL Control Paths
Liang Chen, Mojtaba Ebrahimi, Mehdi B. Tahoori
A Shift-Register Based BIST Architecture for FPGA Global Interconnect Testing and Diagnosis
Igor Gadelha Pereira, Leonardo Alves Dias, Cleonilson Protásio de Souza
Analog Circuits Soft Fault Diagnosis Using Rényi’s Entropy
Xuan Xie, Xifeng Li, Dongjie Bi, Qizhong Zhou, Sanshan Xie, Yongle Xie