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Zeitschrift

Journal of Electronic Testing

Journal of Electronic Testing 2/2020

Ausgabe 2/2020

Inhaltsverzeichnis ( 12 Artikel )

22.04.2020 | Ausgabe 2/2020

Editorial

Vishwani D. Agrawal

15.05.2020 | Ausgabe 2/2020

Test Technology Newsletter

12.05.2020 | Ausgabe 2/2020

A Novel Approach of Data Content Zeroization Under Memory Attacks

Ankush Srivastava, Prokash Ghosh

30.04.2020 | Ausgabe 2/2020

Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter

S. Rathnapriya, V. Manikandan

30.03.2020 | Ausgabe 2/2020

Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin Films

Jinqun Ge, Tian Xia, Guoan Wang

02.04.2020 | Ausgabe 2/2020

Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits

H. El Badawi, Florence Azais, S. Bernard, M. Comte, V. Kerzerho, F. Lefevre

18.03.2020 | Ausgabe 2/2020

An Efficient Algorithm for Optimizing the Test Path of Digital Microfluidic Biochips

Xijun Huang, Chuanpei Xu, Long Zhang

14.04.2020 | Ausgabe 2/2020

Automated Bug Resistant Test Intent with Register Header Database for Optimized Verification

Gaurav Sharma, Lava Bhargava, Vinod Kumar

07.04.2020 | Ausgabe 2/2020

Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs

Tanusree Kaibartta, G. P. Biswas, Debesh Kumar Das

06.03.2020 | Ausgabe 2/2020

Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications

Ambika Prasad Shah, Santosh Kumar Vishvakarma, Michael Hübner

23.05.2020 | Ausgabe 2/2020

Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects

T. Copetti, T. R. Balen, E. Brum, C. Aquistapace, L. Bolzani Poehls

02.04.2020 | Ausgabe 2/2020

Speed-Up in Test Methods Using Probabilistic Merit Indicators

Mahtab Fooladi, Arezoo Kamran

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