Zeitschrift Journal of Electronic Testing Ausgabe 2/2021 share TEILEN Suchen insite SUCHEN Inhaltsverzeichnis (12 Artikel) 13.06.2021 Editorial Vishwani D. Agrawal 17.07.2021 Test Technology Newsletter Open Access 26.05.2021 Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality Zhan Gao, Min-Chun Hu, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Erik Jan Marinissen PDF-Version jetzt herunterladen Zum Volltext 14.04.2021 A Low-Cost, Robust and Tolerant, Digital Scheme for Post-Bond Testing and Diagnosis of TSVs Vasileios Gerakis, Yiorgos Tsiatouhas, Alkis Hatzopoulos 19.03.2021 A Cascaded Multicasting Architecture for Test Data Compression Wang-Dauh Tseng 03.06.2021 Fault Diagnosis Method of Low Noise Amplifier Based on Support Vector Machine and Hidden Markov Model Lu Sun, Yang Li, Han Du, Peipei Liang, Fushun Nian 06.03.2021 Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit H. El Badawi, F. Azais, S. Bernard, M. Comte, V. Kerzerho, F. Lefevre 03.05.2021 Tolerating Soft Errors with Horizontal-Vertical-Diagonal-N-Queen (HVDNQ) Parity Muhammad Sheikh Sadi, Sumaiya Sumaiya, Mouly Dewan, Atikur Rahman 23.04.2021 Radiation Tolerant SRAM Cell Design in 65nm Technology JianAn Wang, Xue Wu, Haonan Tian, Lixiang Li, Shuting Shi, Li Chen 06.05.2021 Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions Cleiton Magano Marques, Cristina Meinhardt, Paulo Francisco Butzen 31.03.2021 Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen 01.04.2021 Method of Implanting Hardware Trojan Based on EHW in Part of Circuit Lijun Liu, Tao Wang, Xiaohan Wang
