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Zeitschrift

Journal of Electronic Testing

Journal of Electronic Testing 2/2021

Ausgabe 2/2021

Inhaltsverzeichnis ( 12 Artikel )

13.06.2021 | Ausgabe 2/2021

Editorial

Vishwani D. Agrawal

17.07.2021 | Ausgabe 2/2021

Test Technology Newsletter

26.05.2021 | Ausgabe 2/2021 Open Access

Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality

Zhan Gao, Min-Chun Hu, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Erik Jan Marinissen

14.04.2021 | Ausgabe 2/2021

A Low-Cost, Robust and Tolerant, Digital Scheme for Post-Bond Testing and Diagnosis of TSVs

Vasileios Gerakis, Yiorgos Tsiatouhas, Alkis Hatzopoulos

19.03.2021 | Ausgabe 2/2021

A Cascaded Multicasting Architecture for Test Data Compression

Wang-Dauh Tseng

03.06.2021 | Ausgabe 2/2021

Fault Diagnosis Method of Low Noise Amplifier Based on Support Vector Machine and Hidden Markov Model

Lu Sun, Yang Li, Han Du, Peipei Liang, Fushun Nian

06.03.2021 | Ausgabe 2/2021

Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit

H. El Badawi, F. Azais, S. Bernard, M. Comte, V. Kerzerho, F. Lefevre

03.05.2021 | Ausgabe 2/2021

Tolerating Soft Errors with Horizontal-Vertical-Diagonal-N-Queen (HVDNQ) Parity

Muhammad Sheikh Sadi, Sumaiya Sumaiya, Mouly Dewan, Atikur Rahman

23.04.2021 | Ausgabe 2/2021

Radiation Tolerant SRAM Cell Design in 65nm Technology

JianAn Wang, Xue Wu, Haonan Tian, Lixiang Li, Shuting Shi, Li Chen

06.05.2021 | Ausgabe 2/2021

Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions

Cleiton Magano Marques, Cristina Meinhardt, Paulo Francisco Butzen

31.03.2021 | Ausgabe 2/2021

Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor

Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen

01.04.2021 | Ausgabe 2/2021

Method of Implanting Hardware Trojan Based on EHW in Part of Circuit

Lijun Liu, Tao Wang, Xiaohan Wang

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