Zeitschrift Journal of Electronic Testing Ausgabe 2/2022 share TEILEN Suchen insite SUCHEN Inhaltsverzeichnis (9 Artikel) 19.05.2022 Editorial Vishwani D. Agrawal 28.04.2022 Test Technology Newsletter Stefano Di Carlo 23.03.2022 Comparison of the Output Parameters of the Memristor-based Op-amp Model and the Traditional Op-amp Model İshak Parlar, M. Nuri Almali 13.05.2022 FAMCroNA: Fault Analysis in Memristive Crossbars for Neuromorphic Applications Dev Narayan Yadav, Phrangboklang Lyngton Thangkhiew, Kamalika Datta, Sandip Chakraborty, Rolf Drechsler, Indranil Sengupta 15.04.2022 An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation Shuo Cai, Binyong He, Sicheng Wu, Jin Wang, Weizheng Wang, Fei Yu 06.04.2022 Low Area FPGA Implementation of AES Architecture with EPRNG for IoT Application N. Siva Balan, B. S. Murugan 20.04.2022 Research on the Mechanical Properties of Magnetorheological Damping and the Performance of Microprobe Test Process Huajie Huang, Junjie Dai, Long Dou, Junfu Liu, Yunpeng Liu, Taotao Chen, Tianxiang Wu, Junhui Li 11.04.2022 Traxtor: An Automatic Software Test Suit Generation Method Inspired by Imperialist Competitive Optimization Algorithms Bahman Arasteh, Seyed Mohamad Javad Hosseini 09.06.2022 Hardware Efficient Approximate Multiplier Architecture for Image Processing Applications Shravani Chandaka, Balaji Narayanam