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Journal of Electronic Testing 2/2022
Journal of Electronic Testing

Ausgabe 2/2022

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Inhaltsverzeichnis (9 Artikel)

19.05.2022

Editorial
Vishwani D. Agrawal

28.04.2022

Test Technology Newsletter
Stefano Di Carlo

23.03.2022

Comparison of the Output Parameters of the Memristor-based Op-amp Model and the Traditional Op-amp Model
İshak Parlar, M. Nuri Almali

13.05.2022

FAMCroNA: Fault Analysis in Memristive Crossbars for Neuromorphic Applications
Dev Narayan Yadav, Phrangboklang Lyngton Thangkhiew, Kamalika Datta, Sandip Chakraborty, Rolf Drechsler, Indranil Sengupta

15.04.2022

An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation
Shuo Cai, Binyong He, Sicheng Wu, Jin Wang, Weizheng Wang, Fei Yu

06.04.2022

Low Area FPGA Implementation of AES Architecture with EPRNG for IoT Application
N. Siva Balan, B. S. Murugan

20.04.2022

Research on the Mechanical Properties of Magnetorheological Damping and the Performance of Microprobe Test Process
Huajie Huang, Junjie Dai, Long Dou, Junfu Liu, Yunpeng Liu, Taotao Chen, Tianxiang Wu, Junhui Li

11.04.2022

Traxtor: An Automatic Software Test Suit Generation Method Inspired by Imperialist Competitive Optimization Algorithms
Bahman Arasteh, Seyed Mohamad Javad Hosseini

09.06.2022

Hardware Efficient Approximate Multiplier Architecture for Image Processing Applications
Shravani Chandaka, Balaji Narayanam

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