Skip to main content


Journal of Electronic Testing

Journal of Electronic Testing 3/2020

Ausgabe 3/2020

Inhaltsverzeichnis ( 12 Artikel )

25.05.2020 | Ausgabe 3/2020


Vishwani D. Agrawal

05.06.2020 | Ausgabe 3/2020

Test Technology Newsletter

31.05.2020 | Ausgabe 3/2020

Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices

Wendong Wang, Ujjwal Guin, Adit Singh

02.06.2020 | Ausgabe 3/2020

Stuck-At Fault Mitigation of Emerging Technologies Based Switching Lattices

Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, Gabriella Trucco, Ioana Vatajelu

06.06.2020 | Ausgabe 3/2020

An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic

Sanjoy Mitra, Debaprasad Das

06.06.2020 | Ausgabe 3/2020

Comprehensive Analysis and Optimization of Reliable Viterbi Decoder Circuits Implemented in Modular VLSI Design Logic Styles

Sushanth Varada, Swapnil Katpally, Subha Sri Lakshmi Thiruveedhi

02.04.2020 | Ausgabe 3/2020

Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation

Dongzhe Yu, Han Wang, Jiangtao Xu

24.05.2020 | Ausgabe 3/2020

A probability density estimation algorithm on multiwavelet for the high-resolution ADC

Min Ma, Jing Huang, Xiaolei Yang, Lingfan Tang

27.04.2020 | Ausgabe 3/2020

Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks

Biswajit Bhowmik

13.06.2020 | Ausgabe 3/2020

Time Complexity Comparison of Stopping at First Failure and Completely Running the Test

Ongun Yucesan, Altan Ozkil

21.05.2020 | Ausgabe 3/2020

High Performance Approximate Memories for Image Processing Applications

R. Jothin, M. Peer Mohamed

18.05.2020 | Ausgabe 3/2020

LoBA: A Leading One Bit Based Imprecise Multiplier for Efficient Image Processing

Bharat Garg, Sujit Kumar Patel, Sunil Dutt

Aktuelle Ausgaben