Journal of Electronic Testing

Editorial

Vishwani D. Agrawal

Test Technology Newsletter

Resistance of the Montgomery Ladder Against Simple SCA: Theory and Practice

Ievgen Kabin, Zoya Dyka, Dan Klann, Marcin Aftowicz, Peter Langendoerfer

A Secure and Robust PUF-based Key Generation with Wiretap Polar Coset Codes

Yonghong Bai, Zhiyuan Yan

Hardware Trojan Free Netlist Identification: A Clustering Approach

Anindan Mondal, Rajesh Kumar Biswal, Mahabub Hasan Mahalat, Suchismita Roy, Bibhash Sen

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs

Carlos J. González, Bruno L. Costa, Diego N. Machado, Rafael G. Vaz, Alexis C. Vilas Bôas, Odair L. Gonçalez, Helmut Puchner, Fernanda L. Kastensmidt, Nilberto H. Medina, Marcilei A. Guazzelli, Tiago R. Balen

Measurement and Simulation of the Near Magnetic Field Radiated by Integrated Magnetic Inductors

M. I. Boukhari, D. A. Oumar, S. Capraro, D. Pietroy, J. P. Chatelon, J. J. Rousseau

Spectrum Analyzer Based on a Dynamic Filter

S. Herasimov, M. Borysenko, E. Roshchupkin, V. I. Hrabchak, Yu. A. Nastishin

Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell

Victor Champac, Javier Mesalles, Hector Villacorta, Fabian Vargas

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, Tiago Balen

A Numeral System Based Framework for Improved One-Lambda Crosstalk Avoidance Code Using Recursive Symmetry Formula

M. Taali, Z. Shirmohammadi

Fault Tolerant Lanczos Eigensolver via an Invariant Checking Method

Felix Loh, Kewal K. Saluja, Parameswaran Ramanathan