Skip to main content

Zeitschrift

Journal of Electronic Testing 3/2021
Journal of Electronic Testing

Ausgabe 3/2021

share
TEILEN
insite
SUCHEN

Inhaltsverzeichnis (12 Artikel)

28.07.2021

Editorial
Vishwani D. Agrawal

31.07.2021

Test Technology Newsletter

Open Access 30.06.2021

Resistance of the Montgomery Ladder Against Simple SCA: Theory and Practice
Ievgen Kabin, Zoya Dyka, Dan Klann, Marcin Aftowicz, Peter Langendoerfer

18.05.2021

A Secure and Robust PUF-based Key Generation with Wiretap Polar Coset Codes
Yonghong Bai, Zhiyuan Yan

19.06.2021

Hardware Trojan Free Netlist Identification: A Clustering Approach
Anindan Mondal, Rajesh Kumar Biswal, Mahabub Hasan Mahalat, Suchismita Roy, Bibhash Sen

05.06.2021

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs
Carlos J. González, Bruno L. Costa, Diego N. Machado, Rafael G. Vaz, Alexis C. Vilas Bôas, Odair L. Gonçalez, Helmut Puchner, Fernanda L. Kastensmidt, Nilberto H. Medina, Marcilei A. Guazzelli, Tiago R. Balen

07.07.2021

Measurement and Simulation of the Near Magnetic Field Radiated by Integrated Magnetic Inductors
M. I. Boukhari, D. A. Oumar, S. Capraro, D. Pietroy, J. P. Chatelon, J. J. Rousseau

10.07.2021

Spectrum Analyzer Based on a Dynamic Filter
S. Herasimov, M. Borysenko, E. Roshchupkin, V. I. Hrabchak, Yu. A. Nastishin

18.08.2021

Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell
Victor Champac, Javier Mesalles, Hector Villacorta, Fabian Vargas

Open Access 01.06.2021

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects
Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, Tiago Balen

05.07.2021

A Numeral System Based Framework for Improved One-Lambda Crosstalk Avoidance Code Using Recursive Symmetry Formula
M. Taali, Z. Shirmohammadi

30.04.2021

Fault Tolerant Lanczos Eigensolver via an Invariant Checking Method
Felix Loh, Kewal K. Saluja, Parameswaran Ramanathan

Aktuelle Ausgaben