Zeitschrift Journal of Electronic Testing Ausgabe 3/2022 share TEILEN Suchen insite SUCHEN Inhaltsverzeichnis (9 Artikel) 20.07.2022 Editorial Vishwani D. Agrawal 02.08.2022 Test Technology Newsletter 07.06.2022 A Systematic Bit Selection Method for Robust SRAM PUFs Wendong Wang, Adit D. Singh, Ujjwal Guin 30.05.2022 The Detection of Malicious Modifications in the FPGA Kamran Zahid 30.06.2022 Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs Trevor Kroeger, Wei Cheng, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi 24.06.2022 Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost Yindong Xiao, Yutong Zeng, Qiong Wu, Ke Liu, Yanjun Li, Chong Hu 29.06.2022 A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony Algorithm Bahman Arasteh, Parisa Imanzadeh, Keyvan Arasteh, Farhad Soleimanian Gharehchopogh, Bagher Zarei 08.06.2022 Deep Soft Error Propagation Modeling Using Graph Attention Network Junchi Ma, Zongtao Duan, Lei Tang 17.06.2022 Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism Brett Sparkman, Scott C. Smith, Jia Di
