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Journal of Electronic Testing 3/2022
Journal of Electronic Testing

Ausgabe 3/2022

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Inhaltsverzeichnis (9 Artikel)

20.07.2022

Editorial
Vishwani D. Agrawal

02.08.2022

Test Technology Newsletter

07.06.2022

A Systematic Bit Selection Method for Robust SRAM PUFs
Wendong Wang, Adit D. Singh, Ujjwal Guin

30.05.2022

The Detection of Malicious Modifications in the FPGA
Kamran Zahid

30.06.2022

Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs
Trevor Kroeger, Wei Cheng, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi

24.06.2022

Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost
Yindong Xiao, Yutong Zeng, Qiong Wu, Ke Liu, Yanjun Li, Chong Hu

29.06.2022

A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony Algorithm
Bahman Arasteh, Parisa Imanzadeh, Keyvan Arasteh, Farhad Soleimanian Gharehchopogh, Bagher Zarei

08.06.2022

Deep Soft Error Propagation Modeling Using Graph Attention Network
Junchi Ma, Zongtao Duan, Lei Tang

17.06.2022

Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism
Brett Sparkman, Scott C. Smith, Jia Di

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