Ausgabe 3/2022
Inhalt (9 Artikel)
Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs
Trevor Kroeger, Wei Cheng, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost
Yindong Xiao, Yutong Zeng, Qiong Wu, Ke Liu, Yanjun Li, Chong Hu
A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony Algorithm
Bahman Arasteh, Parisa Imanzadeh, Keyvan Arasteh, Farhad Soleimanian Gharehchopogh, Bagher Zarei
Deep Soft Error Propagation Modeling Using Graph Attention Network
Junchi Ma, Zongtao Duan, Lei Tang
Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism
Brett Sparkman, Scott C. Smith, Jia Di