Ausgabe 4/2017
Inhalt (13 Artikel)
Hardware Trojan Detection Based on Logical Testing
Amin Bazzazi, Mohammad Taghi Manzuri Shalmani, Ali Mohammad Afshin Hemmatyar
Grouped Genetic Algorithm Based Optimal Tests Selection for System with Multiple Operation Modes
ChengLin Yang, Fang Chen, Shulin Tian
An Automatic Functional Coverage for Digital Systems Through a Binary Particle Swarm Optimization Algorithm with a Reinitialization Mechanism
Alfonso Martínez-Cruz, Ricardo Barrón-Fernández, Herón Molina-Lozano, Marco-Antonio Ramírez-Salinas, Luis-Alfonso Villa-Vargas, Prometeo Cortés-Antonio, Kwang-Ting (Tim) Cheng
A Near-Threshold Soft Error Resilient 7T SRAM Cell with Low Read Time for 20 nm FinFET Technology
Rahebeh Niaraki Asli, Shiva Taghipour
Open Access
Susceptible Workload Evaluation and Protection using Selective Fault Tolerance
Mauricio D. Gutierrez, Vasileios Tenentes, Daniele Rossi, Tom J. Kazmierski
ACM: An Energy-Efficient Accuracy Configurable Multiplier for Error-Resilient Applications
Bharat Garg, G. K. Sharma
Test of Mechanical Failure for Via Holes and Solder Joints of Complex Interconnect Structure
Yuling Shang, Liyuan Sun, Chunquan Li, Jianfeng Ma
A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-Chip
Babak Aghaei, Ahmad Khademzadeh, Midia Reshadi, Kambiz Badie
Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies
Amit Karel, Mariane Comte, Jean-Marc Galliere, Florence Azais, Michel Renovell
Built-In Fault Localization Circuitry for High Performance FPGA Based Implementations
Ayan Palchaudhuri, Anindya Sundar Dhar