Journal of Electronic Testing

Editorial

Vishwani D. Agrawal

Test Technology Newsletter

Test and Reliability in Approximate Computing

Lorena Anghel, Mounir Benabdenbi, Alberto Bosio, Marcello Traiola, Elena Ioana Vatajelu

High Performance Static Segment On-Chip Memory for Image Processing Applications

R. Jothin, C. Vasanthanayaki

Leakage-Aware Droop Measurement Built-in Self-Test Circuit for Digital Low-Dropout Regulators

Aydin Dirican, Cagatay Ozmen, Martin Margala

An Extensible Code for Correcting Multiple Cell Upset in Memory Arrays

Felipe Silva, Jardel Silveira, Jarbas Silveira, César Marcon, Fabian Vargas, Otávio Lima Jr

Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories

Shyue-Kung Lu, Hao-Cheng Jheng, Hao-Wei Lin, Masaki Hashizume

Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition

Ying Zhang, Li Ling, Jianhui Jiang, Jie Xiao

Hardware Trojan Detection Using an Advised Genetic Algorithm Based Logic Testing

M. A. Nourian, M. Fazeli, D. Hely

Low-Power Resonant Clocking Using Soft Error Robust Energy Recovery Flip-Flops

Riadul Islam

Fault Tolerance Mechanisms for FPGA-Based Regular Expression Matching

Marcos T. Leipnitz, Gabriel L. Nazar