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Journal of Electronic Testing 4/2021
Journal of Electronic Testing

Ausgabe 4/2021

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Inhaltsverzeichnis (12 Artikel)

11.10.2021

Editorial
Vishwani D. Agrawal

17.09.2021

Test Technology Newsletter

Open Access 21.10.2021

Review of Manufacturing Process Defects and Their Effects on Memristive Devices
L. M. Bolzani Poehls, M. C. R. Fieback, S. Hoffmann-Eifert, T. Copetti, E. Brum, S. Menzel, S. Hamdioui, T. Gemmeke

28.09.2021

Neuro-Fuzzy Evaluation of the Software Reliability Models by Adaptive Neuro Fuzzy Inference System
Milos Milovancevic, Aleksandar Dimov, Kamen Boyanov Spasov, Ljubomir Vračar, Miroslav Planić

30.09.2021

Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits
Tsai-Chieh Chen, Chia-Cheng Pai, Yi-Zhan Hsieh, Hsiao-Yin Tseng, James Chien-Mo, Tsung-Te Liu, I-Wei Chiu

24.08.2021

SC-COTD: Hardware Trojan Detection Based on Sequential/Combinational Testability Features using Ensemble Classifier
Mahshid Tebyanian, Azadeh Mokhtarpour, Alireza Shafieinejad

25.08.2021

Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications
Aibin Yan, Aoran Cao, Zhelong Xu, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen

14.08.2021

Fault-Aware Dependability Enhancement Techniques for Phase Change Memory
Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase, Chun-Lung Hsu, Chi-Tien Sun

11.10.2021

Performances and Stability Analysis of a Novel 8T1R Non-Volatile SRAM (NVSRAM) versus Variability
Hussein Bazzi, Hassen Aziza, Mathieu Moreau, Adnan Harb

03.11.2021

Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers
Marco Grossi, Martin Omaña

18.09.2021

Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems
Qi Wang, Yiming Ouyang, Yingchun Lu, Huaguo Liang, Dakai Zhu

26.06.2021

HVoC: a Hybrid Model Checking - Interactive Theorem Proving Approach for Functional Verification of Digital Circuits
Mishal Fatima Minhas, Osman Hasan, Sa’ed Abed

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