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Journal of Electronic Testing 4/2022
Journal of Electronic Testing

Ausgabe 4/2022

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Inhaltsverzeichnis (10 Artikel)

09.09.2022

Editorial
Vishwani D. Agrawal

13.08.2022

The Newsletter of the Test Technology Technical Council of the IEEE Computer Society

04.08.2022

Applying Artificial Neural Networks to Logic Built-in Self-test: Improving Test Point Insertion
Yang Sun, Spencer K. Millican

26.07.2022

CMOS Implementation and Performance Analysis of Known Approximate 4:2 Compressors
Parthibaraj Anguraj, Thiruvenkadam Krishnan, Saravanan Subramanian

04.07.2022

Efficient Design of Rounding Based Static Segment Imprecise Multipliers for Error Tolerance Application
D. Tilak Raju, Y. Srinivasa Rao

16.08.2022

A New Approximate 4-2 Compressor using Merged Sum and Carry
Chinthalgiri Jyothi, K. Saranya, Bhaskara Rao Jammu, Sreehari Veeramachaneni, SK Noor Mahammad

Open Access 31.08.2022

Automated Design Error Debugging of Digital VLSI Circuits
Mohammed Moness, Lamya Gaber, Aziza I. Hussein, Hanafy M. Ali

08.08.2022

Novel Fault-Tolerant Processing in Memory Cell in Ternary Quantum-Dot Cellular Automata
Leila Dehbozorgi, Reza Sabbaghi-Nadooshan, Alireza Kashaninia

03.08.2022

Experimental and Simulation Results of Wien Bridge Oscillator Circuıt Realized wıth Op-Amp Designed Using a Memristor
İshak Parlar, M. Nuri Almali

25.07.2022

Temperature and Humidity Controlled Test Bench for Temperature Sensor Characterization
Syed Usman Amin, Muhammad Aaquib Shahbaz, Syed Arsalan Jawed, Fahd Khan, Muhammad Junaid, Danish Kaleem, Musaddiq Siddiq, Zain Warsi, Naveed

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