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Journal of Electronic Testing

Ausgabe 5/2018

Inhalt (10 Artikel)

Editorial

Vishwani D. Agrawal

An Efficient SAT-Based Test Generation Algorithm with GPU Accelerator

Muhammad Osama, Lamya Gaber, Aziza I. Hussein, Hanafy Mahmoud

Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP

Vladimir Chepelev, Yury Parfenov, William Radasky, Boris Titov, Leonid Zdoukhov, Kejie Li, Yuhao Chen, Xu Kong, Yan-zhao Xie

Impact of Aging on the Reliability of Delay PUFs

Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley

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