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Journal of Electronic Testing 5-6/2021
Journal of Electronic Testing

Ausgabe 5-6/2021

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Inhaltsverzeichnis (13 Artikel)

09.12.2021

Editorial
Vishwani D. Agrawal

14.01.2022

2020 JETTA-TTTC Best Paper Award

12.01.2022

TTTC Newsletter

19.11.2021

On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization
Muralidharan Jayabalan, E. Srinivas, Francis H. Shajin, P. Rajesh

10.12.2021

A Framework for Configurable Joint-Scan Design-for-Test Architecture
Jaynarayan T. Tudu, Satyadev Ahlawat, Sonali Shukla, Virendra Singh

Open Access 10.01.2022

Analysis of Security Vulnerability Levels of In-Vehicle Network Topologies Applying Graph Representations
Zsombor Petho, Intiyaz Khan, Árpád Torok

10.11.2021

Error-Efficient Approximate Multiplier Design using Rounding Based Approach for Image Smoothing Application
E. Jagadeeswara Rao, P. Samundiswary

11.12.2021

Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement
Sisir Kumar Jena, Santosh Biswas, Jatindra Kumar Deka

01.02.2022

Reducing Aging Impacts in Digital Sensors via Run-Time Calibration
Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi

04.01.2022

A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment
Takefumi Yoshikawa, Masahiro Ishimaru, Tatsuya Iwata, Fuma Mori, Kazutoshi Kobayashi

08.12.2021

Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilog
Nikolaos Georgoulopoulos, Alkiviadis Hatzopoulos

19.11.2021

A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm
Xiaoyan Yang, Chenglin Yang, Houjun Wang

Open Access 04.01.2022

Stress-Aware Periodic Test of Interconnects
Somayeh Sadeghi-Kohan, Sybille Hellebrand, Hans-Joachim Wunderlich

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