Zeitschrift Journal of Electronic Testing Ausgabe 5-6/2021 share TEILEN Suchen insite SUCHEN Inhaltsverzeichnis (13 Artikel) 09.12.2021 Editorial Vishwani D. Agrawal 14.01.2022 2020 JETTA-TTTC Best Paper Award 12.01.2022 TTTC Newsletter 19.11.2021 On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization Muralidharan Jayabalan, E. Srinivas, Francis H. Shajin, P. Rajesh 10.12.2021 A Framework for Configurable Joint-Scan Design-for-Test Architecture Jaynarayan T. Tudu, Satyadev Ahlawat, Sonali Shukla, Virendra Singh Open Access 10.01.2022 Analysis of Security Vulnerability Levels of In-Vehicle Network Topologies Applying Graph Representations Zsombor Petho, Intiyaz Khan, Árpád Torok PDF-Version jetzt herunterladen Zum Volltext 10.11.2021 Error-Efficient Approximate Multiplier Design using Rounding Based Approach for Image Smoothing Application E. Jagadeeswara Rao, P. Samundiswary 11.12.2021 Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement Sisir Kumar Jena, Santosh Biswas, Jatindra Kumar Deka 01.02.2022 Reducing Aging Impacts in Digital Sensors via Run-Time Calibration Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi 04.01.2022 A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment Takefumi Yoshikawa, Masahiro Ishimaru, Tatsuya Iwata, Fuma Mori, Kazutoshi Kobayashi 08.12.2021 Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilog Nikolaos Georgoulopoulos, Alkiviadis Hatzopoulos 19.11.2021 A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm Xiaoyan Yang, Chenglin Yang, Houjun Wang Open Access 04.01.2022 Stress-Aware Periodic Test of Interconnects Somayeh Sadeghi-Kohan, Sybille Hellebrand, Hans-Joachim Wunderlich PDF-Version jetzt herunterladen Zum Volltext
