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Journal of Electronic Testing

Journal of Electronic Testing 6/2019

Ausgabe 6/2019

Inhaltsverzeichnis ( 14 Artikel )

12.12.2019 | Ausgabe 6/2019


Vishwani D. Agrawal

17.12.2019 | Ausgabe 6/2019

The Newsletter of the Test Technology Technical Council of the IEEE Computer Society Editor: Theo Theocharides

27.11.2019 | Ausgabe 6/2019

DVFS Based Error Avoidance Strategy in Wireless Network-on-Chip

Yiming Ouyang, Qi Wang, Lizhu Hu, Huaguo Liang

13.11.2019 | Ausgabe 6/2019

Fault Localization and Testability Approaches for FPGA Fabric Aware Canonic Signed Digit Recoding Implementations

Ayan Palchaudhuri, Anindya Sundar Dhar

11.12.2019 | Ausgabe 6/2019

Multi-Step-Ahead Prediction for a CMOS Low Noise Amplifier Aging Due to NBTI and HCI Using Neural Networks

Chuang Yang, Feng Feng

20.01.2020 | Ausgabe 6/2019

Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition

Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee

26.12.2019 | Ausgabe 6/2019

Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect Quality Metrics

Omar Al-Terkawi Hasib, Yvon Savaria, Claude Thibeault

18.12.2019 | Ausgabe 6/2019

An Efficient Technique to Detect Stealthy Hardware Trojans Independent of the Trigger Size

S. M. Sebt, A. Patooghy, H. Beitollahi

04.12.2019 | Ausgabe 6/2019

Leveraging Balanced Logic Gates as Strong PUFs for Securing IoT Against Malicious Attacks

Weize Yu, Yiming Wen

11.01.2020 | Ausgabe 6/2019

Comparing Graph-Based Algorithms to Generate Test Cases from Finite State Machines

Matheus Monteiro Mariano, Érica Ferreira de Souza, André Takeshi Endo, Nandamudi Lankalapalli Vijaykumar

30.12.2019 | Ausgabe 6/2019

Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack

Yi Sun, Fanchen Zhang, Hui Jiang, Kundan Nepal, Jennifer Dworak, Theodore Manikas, R. Iris Bahar

26.10.2019 | Ausgabe 6/2019

Design of Approximate Subtractors and Dividers for Error Tolerant Image Processing Applications

Anusha Gorantla, P. Deepa

02.10.2019 | Ausgabe 6/2019

A Single Event Upset Resilient Latch Design with Single Node Upset Immunity

Xixi Dai, Haibin Wang, Jiamin Chu, Zhi Liu, Li Cai, Kang Yan

26.12.2019 | Ausgabe 6/2019

Noise and Spur Comparison of Delta-Sigma Modulators in Fractional-N PLLs

Bo Zhou, Yao Li, Fuyuan Zhao

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