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Journal of Electronic Testing

Journal of Electronic Testing 6/2020

Ausgabe 6/2020

Inhaltsverzeichnis ( 11 Artikel )

06.01.2021 | Ausgabe 6/2020


Vishwani D. Agrawal

07.12.2020 | Ausgabe 6/2020

2019 JETTA-TTTC Best Paper Award

Breeta SenGupta, Dimitar Nikolov, Assmitra Dash and Erik Larsson, “Test Flow Selection for Stacked Integrated Circuits,” Journal of Electronic Testing: Theory and Applications, Volume 35, Number 4, Pages 425–440, August 2019.

07.12.2020 | Ausgabe 6/2020

Test Technology Newsletter

18.12.2020 | Ausgabe 6/2020

Diagnosis and Compensation of Control Program, Sensor and Actuator Failures in Nonlinear Systems Using Hierarchical State Space Checks

Md Imran Momtaz, Abhijit Chatterjee

06.01.2021 | Ausgabe 6/2020

Low-Cost Error Detection in Deep Neural Network Accelerators with Linear Algorithmic Checksums

Elbruz Ozen, Alex Orailoglu

06.12.2020 | Ausgabe 6/2020

A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal Circuits

Sayandeep Sanyal, Mayukh Bhattacharya, Amit Patra, Pallab Dasgupta

21.11.2020 | Ausgabe 6/2020

Identification of Logic Paths Influenced by Severe Coupling Capacitances

I. D. Meza-Ibarra, V. Champac, R. Gomez-Fuentes, J. R. Noriega, A. Vera-Marquina

02.12.2020 | Ausgabe 6/2020

Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAs

Akin Gokalan, Suleyman Tosun, Deniz Dal

04.12.2020 | Ausgabe 6/2020

Efficient Designs of Reversible Majority Voters

Davar Kheirandish, Majid Haghparast, Midia Reshadi, Mehdi Hosseinzadeh

15.12.2020 | Ausgabe 6/2020

Detection and Diagnosis of Multi-Fault for through Silicon Vias in 3D IC

Yuling Shang, Weipeng Tan, Chunquan Li, Haihua Fan, Lizhen Zeng

15.12.2020 | Ausgabe 6/2020

Proton Beam Validation of a New Single Event Transient Mitigation Technique

Farouk Smith

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