Ausgabe 12/2001
Inhalt (9 Artikel)
Characterization of laser annealed polycrystalline silicon films on various substrates
Chung Yi, Shi-Woo Rhee, Jin-Ho Ju, Sung-Kyun Yim, Hoonkee Min
Electrical properties of Pd–Au/(In x –Sn1 – x ) Oxide/Si(p)/Al heterojunction diodes
M. A. Ahmed, I. Mekkawy, A. A. Azab
Self-extinguishing epoxy molding compound with no flame-retarding additives for electronic components
Masatoshi Iji, Yukihiro Kiuchi
Ellipsometry study of InN thin films prepared by magnetron sputtering
F. Li, D. Mo, C. B. Cao, Y. L. Zhang, H. L. W. Chan, C. L. Choy
Dielectric and ferroelectric properties of Ba3M3Ti5Nb5O30 (M=Sm or Y) ceramics
P. Prabhakar Rao, S. K. Ghosh, Peter Koshy
Stability of chromium diffusion barriers during anodic bonding in silicon resistor devices
Constance Williams, Hugo F. López