Ausgabe 3/2000
Inhalt (11 Artikel)
Review X-ray photoconductors and stabilized a-Se for direct conversion digital flat-panel X-ray image-detectors
S. O. Kasap, J. A. Rowlands
Microstructural, XRD and electrical characterization of some thick film resistors
Marko Hrovat, Zoran Samardzija, Janez Holc, Darko Belavic
Effects and interactions of design parameters for gold-plated electric contacts
R. Martens, M. Pecht
Preparation and optical properties of a poly(N-vinylcarbazole) material
L. Zhang, G. Zhang, G. O. Carlisle, G.A. Crowder
A structural model of Cr/(Ba,Pb)TiO3 positive temperature coefficient composite
Zeming He, Jan Ma, Yuanfang Qu, Chenggang Wang
Structural and magnetic characterization of nanocrystalline Ni-20%Fe permalloy films
F. Czerwinski, J. A. Szpunar, U. Erb
Next generation integral passives: materials, processes, and integration of resistors and capacitors on PWB substrates
Swapan K. Bhattacharya, Rao R. Tummala
The effect of sulfur concentration on the properties of chemical bath deposited CdS thin films
Kodigala Subba Ramaiah, Anil Kumar Bhatnagar, R. D. Pilkington, A. E. Hill, R. D. Tomlinson