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Journal of Materials Science: Materials in Electronics

Ausgabe 4/2000

Inhalt (14 Artikel)

Probabilistic strength of {1 1 1} n-type silicon

A. A. Wereszczak, A. S. Barnes, K. Breder, Sukhminder Binapal

Growth, optical transmission and X-ray photoemission studies of BaB2O4 single crystals

S. C. Sabharwal, Sangeeta, Madhumita Goswami, S. K. Kulkarni, B. D. Padalia

Studies on phase transformations of Cu-phthalocyanine thin films

O. Berger, W.-J. Fischer, B. Adolphi, S. Tierbach, V. Melev, J. Schreiber

Deposition and characterization of screen-printed porous multi-layer thick film structures from semiconducting and conducting nanomaterials for use in photovoltaic devices

S. Burnside, S. Winkel, K. Brooks, V. Shklover, M. Gra¨tzel, A. Hinsch, R. Kinderman, C. Bradbury, A. Hagfeldt, H. Pettersson

A thin-film tin-oxide carbon monoxide sensor for exhaust gas analysis

E. W. Williams, N. Tomlinson, M. T. Cheney, A. G. Keeling

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