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Journal of Materials Science: Materials in Electronics

Ausgabe 5/2008

Inhalt (16 Artikel)

Stress sensitivity of inductance in NiMgCuZn ferrites and development of a stress insensitive ferrite composition for microinductors

Narla Varalaxmi, N. Ramamanohar Reddy, Mudinepalli Venkata Ramana, Eyunni Rajagopal, V. Ramakrishna Murthy, Kota Venkata Sivakumar

Effect of underfill on bending fatigue behavior of chip scale package

Bo-In Noh, Noh-Chang Park, Won-Sik Hong, Seung-Boo Jung

Open Access

High tunabilty Ba0.6Sr0.4TiO3 thin films fabricated on Pt–Si substrates with La0.5Sr0.5CoO3 buffer layer

W. F. Qin, J. Xiong, J. Zhu, J. L. Tang, W. J. Jie, X. H. Wei, Y. Zhang, Y. R. Li

Electrical properties of electrodeposited polyaniline nanotubes

Edson Giuliani R. Fernandes, Demetrio Artur W. Soares, Alvaro Antonio Alencar De Queiroz

Microwave dielectric ceramics in the BaO–TiO2–ZnO system doped with Nb2O5

Liying Chen, Shunhua Wu, Shuang Wang, Guoqing Wang

Structure and dielectric characteristics of epitaxially strained BaTiO3 thin films

Jin-Long Tang, Jun Zhu, Wen-Feng Qin, Jie Xiong, Yan-Rong Li

Electronic characterization of several 100 μm thick epitaxial GaAs layers

N. Talbi, K. Khirouni, G. C. Sun, H. Samic, J. C. Bourgoin

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