Anzeige
Erschienen in:
2005 | OriginalPaper | Buchkapitel
TEM Specimens and Images
verfasst von : Ray F. Egerton
Erschienen in: Physical Principles of Electron Microscopy
Verlag: Springer US
Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.
Wählen Sie Textabschnitte aus um mit Künstlicher Intelligenz passenden Patente zu finden. powered by
Markieren Sie Textabschnitte, um KI-gestützt weitere passende Inhalte zu finden. powered by
In the transmitted-light microscope, variation of intensity within an image is caused by differences in the
absorption
of photons within different regions of the specimen. In the case of a TEM, however, essentially
all
of the incoming electrons are transmitted through the specimen, provided it is suitably thin. Although not absorbed, these electrons are
scattered
(deflected in their path) by the atoms of the specimen. To understand the formation and interpretation of TEM images, we need to examine the nature of this cattering process.