Abstract
Since tunable, high-intensity synchrotron radiation sources have become available, the use of x-ray anomalous scattering for structural studies has become generally applicable. We shall review in this paper, the progress that has been made at Stanford Synchrotron Radiation Laboratory in measuring anomalous scattering factors, and their application to structural studies of crystalline and amorphous materials. The measurements show generally that anomalous scattering factors are quite large. Work on crystalline systems has concentrated on protein structure analysis and on a partially disordered inorganic system, while work on amorphous systems has concentrated on obtaining weighted sums of partial distribution functions related to those yielded by EXAFS. We shall therefore discuss the relative advantages of each technique for amorphous structure analysis.
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© 1981 Plenum Press, New York
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Fuoss, P., Bienenstock, A. (1981). X-Ray Anomalous Scattering Factors — Measurements and Applications. In: Fabian, D.J., Kleinpoppen, H., Watson, L.M. (eds) Inner-Shell and X-Ray Physics of Atoms and Solids. Physics of Atoms and Molecules. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-9236-5_171
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DOI: https://doi.org/10.1007/978-1-4615-9236-5_171
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