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High-Resolution Electron Microscopy for Materials Science

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  • © 1998

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Table of contents (4 chapters)

Keywords

About this book

High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

Authors and Affiliations

  • Institute for Advanced Materials Processing, Tohoku University, Aoba-ku, Sendai, Miyagi, Japan

    Daisuke Shindo

  • Institute for Materials Research, Tohoku University, Aoba-ku, Sendai, Miyagi, Japan

    Kenji Hiraga

Bibliographic Information

  • Book Title: High-Resolution Electron Microscopy for Materials Science

  • Authors: Daisuke Shindo, Kenji Hiraga

  • DOI: https://doi.org/10.1007/978-4-431-68422-0

  • Publisher: Springer Tokyo

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Tokyo 1998

  • Softcover ISBN: 978-4-431-70234-4Published: 01 September 1998

  • eBook ISBN: 978-4-431-68422-0Published: 06 December 2012

  • Edition Number: 1

  • Number of Pages: IX, 190

  • Additional Information: Original Japanese edition published by Kyrositsu Shuppan 1996

  • Topics: Characterization and Evaluation of Materials, Measurement Science and Instrumentation

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