Abstract
Internal oxidation pretreatments carried out in quartz capsule with a Rhines pack were found to have a profound effect on the subsequent oxidation behavior of alloys. Specimens of Co-15 wt.% Cr, Co-25 wt.% Cr, Ni-25 wt.% Cr, and Ni-25 wt.% Cr-1 wt.% Al were tested at 1100°C after pre-oxidation treatments. Even without the development of internal oxide particles, pretreated binary CoCr and NiCr alloys oxidized with significantly lower rates. Selective oxidation of chromium was observed on the non-Cr2O3-forming Co-base alloys, whereas on the Cr2O3-forming Ni-base alloys, elimination of base-metal oxide, reduction in the Cr2O3 growth rate, and better scale adhesion were found. These effects were more apparent with pre-oxidation temperatures greater than 1000°C and with longer pretreatment times. Contaimination of Si from the quartz is believed to be the cause.
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References
D. P. Whittle and J. Stringer,Phil. Trans. Roy. Soc. London,A27, 309 (1979).
J. Stringer and P. Y. Hou, inCorrosion and Particle Erosion at High Temperatures, V. Srinivasan and K. Vedula, eds. (TMS Pub., 1989), p. 383.
J. Stringer,Mat. Sci. and Eng. (in press).
G. R. Wallwork and A. Z. Hed,Oxid. Met. 3, 229 (1971).
C. S. Giggins and F. S. Pettit,Met. Trans. 2, 1071 (1971).
D. P. Whittle, M. E. El Dahshan, and J. Stringer,Corros. Sci. 17, 879 (1977).
I. G. Wright, B. A. Wilcox, and R. I. Jaffee,Oxid. Met. 9, 275 (1975).
H. T. Michels,Met. Trans. 7A, 379 (1976).
L. M. Kingsley and J. Stringer,Oxid. Met. 32, 371 (1989).
P. Y. Hou and J. Stringer,J. Electrochem. Soc. 134, 1836–1849 (1987).
P. Y. Hou and J. Stringer,Proc. Symp. on Adhesion in Solids, Vol. 119, 205–211, MRS Spring meeting, Reno, Nevada, April 5–9 (1988).
R. J. Blattner and C. A. Evans, Jr.,Scanning Electron Microscopy,4, 55–65 (1980).
J. G. Smeggil, inCorrosion and Particle Erosion at High Temperatures, V. Srinivasan and K. Vedula, eds. (TMS Pub., 1989), p. 403.
J. L. Smialek,Met. Trans.,18A, 164–167 (1987).
D. Caplan and M. Cohen,J. Electrochem. Soc.,108, 438–441 (1961).
D. E. Jones and J. Stringer,Oxid. Met. 9, 409 (1975).
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Hou, P.Y., Stringer, J. Effect of internal oxidation pretreatments and Si contamination on oxide-scale growth and spalling. Oxid Met 33, 357–369 (1990). https://doi.org/10.1007/BF00666805
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DOI: https://doi.org/10.1007/BF00666805