Abstract
Atomic force microscopy has been used to image plant chromosomes from standard preparations without staining or coating. This has enabled the collection of high-resolution three-dimensional data on surface structure. The technique has been further applied to the imaging of C-banded chromosomes revealing structural changes resulting from the banding treatment. The bands were observed as localized areas of high relief.
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Winfield, M., McMaster, T.J., Karp, A. et al. Atomic force microscopy of plant chromosomes. Chromosome Res 3, 128–131 (1995). https://doi.org/10.1007/BF00710674
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DOI: https://doi.org/10.1007/BF00710674