Abstract
The structure of a Σ5 (210) boundary in rutile was investigated by high resolution electron microscopy (HREM). The boundary was stepped with an average inclination of about 5° from the symmetrical (210) plane. The steps were associated with 1/5[210] DSC lattice dislocations accommodating a deviation of about 2° from the exact Σ5 misorientation of 53.1°, and resulting in a misorientation of 51°. The boundary topography, the location of structural units and the local symmetry were determined using pattern recognition techniques. Flat terraces between steps had a periodic Σ5 (210) structure which exhibited mirror glide symmetry. Image simulations showed best agreement with experimental images for a model structure with a rigid body shift of 0.21 nm parallel, and a 0.10 nm volume contraction normal to the interface. This structure requires a high density of defects or an excess of Ti ions, presumably of lower oxidation state.
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References
Mat. Sci. Forum, 126–128 (1993).
Acta Met. Mat.40 Supplement (1992).
Ultramicroscopy52 (1993).
A. Bourret, J.L. Rouviere, and J.M. Penisson, Acta Cryst. A44, 838 (1988).
K.L. Merkle, Coll. Physique41, 251 (1990).
M.J. Mills and M.S. Daw, MRS Proc.183, 15 (1990).
U. Dahmen, C.J.D. Hetherington, M.A. O'Keefe, K.H. Westmacott, M.J. Mills, M.S. Daw, and V. Vitek, Phil Mag. Lett.62, 327 (1990).
G.H. Campbell, S.M. Foiles, P. Gumbsch, M. Rühle, and W.E. King, Phys. Rev. Lett.70, 449 (1993).
G.H. Campbell, W.L. Wien, W.E. King, and S.M. Foiles, Ultramicroscopy, in press.
W.E. King and G.E. Campbell, MRS Proc.295, 83 (1993).
L.K. Fionova and A.V. Artemyev,Grain Boundaries in Metals and Semiconductors (Les Editions de Physique, 1993).
M.D. Vaudin, M. Rühle, and S.L. Sass, Acta Met.31, 1109 (1983).
J.A. Eastman, M.D. Vaudin, K.L. Merkle, and S.L. Sass, Phil. Mag. A59 465 (1989).
K.L. Merkle, J.F. Reddy, and C.L. Wiley, Ultramicroscopy18, 281 (1985).
D. Chowdhury and R. Carpenter, MSA Bull22, 61 (1992).
K.L. Merkle and D.J. Smith, Phys. Rev. Lett.59, 2997 (1987).
D.M. Duffy and P.W. Tasker, Phil. Mag. A47, 817 (1983).
V. Ravikumar and V. Dravid, Ultramicroscopy52, 557 (1993).
W.-Y. Lee, P.D. Bristowe, I.G. Solorzano, and J.B. Vandersande, MRS Proc.314, in press.
M.A. O'Keefe, U. Dahmen, and C.J.D. Hetherington, MRS Proc.159, 453 (1989).
M.A. O'Keefe and V. Radmilovic, MSA Proc.51, 980 (1993).
J.V. Smith,Geometrical and Structural Crystallography (J. Wiley, New York, 1982).
M.I. Buckett and K.L. Merkle, MSA Proc.51, 982 (1993).
S. Paciornik, R. Kilaas, J. Turner and U. Dahmen, Ultramicroscopy, to be submitted.
R.W. Balluffi, A. Brokman, and A.H. King, Acta Met., 1453 (1982).
L.A. Bursill and B.G. Hyde, inProgress in Solid State Chemistry, edited by H. Reiss and J.O. McCaldin (Pergamon, New York, 1972). Chap. 6.
M.G. Blanchin, L.A. Bursill, and D.J. Smith, Proc. R. Soc. Lond. A391, 351 (1984).
D.J. Smith, L.A. Bursill, and M.G. Blanchin, Phil. Mag. A50, 473 (1984).
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Dahmen, U., Paciornik, S., Solorzano, I.G. et al. HREM analysis of structure and defects in a Σ5 (210) grain boundary in rutile. Interface Sci 2, 125–136 (1994). https://doi.org/10.1007/BF01184507
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DOI: https://doi.org/10.1007/BF01184507