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X-ray reflectivity investigations of glass surfaces produced by float and draw techniques

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Abstract

Surfaces of soda-lime glass and borosilicate glass have been investigated by grazing incidence X-ray reflectivity (GIXR). Characteristic differences are obtained in dependence on the fabrication procedure, the composition and the cleaning procedure. Strong variation is recorded between the two soda-lime float glass surfaces while minor differences are analysed between the top and bottom side of borosilicate float glass. This is attributed to the reduced amount of tin diffused into the bottom side of the borosilicate glass surface. Different cleaning procedures generate characteristic changes on the glass surfaces which can be verified by GIXR. The results indicate that borosilicate float glass combines the merits of the good surface quality of float glass with the high chemical resistivity of borosilicate glass.

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References

  1. W. E. Baitinger, P. W. French, E. L. SwartsJ. Non Cryst. Solids 1980,38/39, 749.

    Google Scholar 

  2. F. Müller, S.-K. Lim, F. Gebhardt, D. KüstnerGlastechn. Ber. 1989,62, 369.

    Google Scholar 

  3. H. Zabel, I. K. Robinson (eds.),Surface X-Ray and Neutron Scattering, Springer, Berlin Heidelberg New York, 1992.

    Google Scholar 

  4. H. J. Lauter, V. V. Pasyuk (eds.),Physica B 1994,198.

  5. R. W. James,The Optical Principles of the Diffraction of X-rays, Cornell University Press New York, Chapter 4, 1965.

    Google Scholar 

  6. L. Névot, P. Croce,Rev. Phys. Appl. 1980,15, 761.

    Google Scholar 

  7. B. Lengeier, in:Photoemission and Absorption Spectroscopy of Solids and Interfaces with Synchrotron Radiation (M. Campagna, K. Rosei eds.), North Holland, Amsterdam, 1990.

    Google Scholar 

  8. B. Lengeier, in:X-ray Absorption Fine Structure (S. S. Hasnain, ed.), Ellis Horwood, 1991.

  9. Program “GIXA”, PHILIPS Analytical X-ray, NL-Almelo.

  10. L. G. Paratt,Phys. Rev. 1954,95, 359.

    Google Scholar 

  11. W. H. Press, S. A. Teukolsky, Comp. Phy.1991,Jul/Aug, 426.

  12. L. Kisse, R. H. Pratt,Acta Cryst. 1990,A46, 170.

    Google Scholar 

  13. D. T. Cromer, Program “FPRIME”, 1992.

  14. K. Bange, et al.,Stabilization of Oxidic Thin Films, BMFT Final Rep. 13N5476, 1991.

  15. M. Hüppauff, B. Lengeler,J. Appl. Phys. 1994,75, 785.

    Google Scholar 

  16. M. Laube. F. Rauch, in preparation.

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Dedicated to Professor Dr. rer. nat. Dr. h.c. Hubertus Nickel on the occasion of his 65th birthday

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Anderson, O., Daalderop, G.H.O. & Bange, K. X-ray reflectivity investigations of glass surfaces produced by float and draw techniques. Mikrochim Acta 125, 63–67 (1997). https://doi.org/10.1007/BF01246163

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