Abstract
Diffusion soldering is a special bonding technique to produce joints at a moderate temperature that are subsequently stable at higher temperatures. The search for material systems extending the upper-temperature limit of stability requires information from the pertinent phase diagrams and the reaction kinetics. Combining experimental studies on phase equilibration in powder samples with bulk and thin-film diffusion couples is a useful approach for a systematic search. Promising candidates for dsoldering are Pt-In or Pd-In, and molybdenum is also an effective diffusion barrier against the attack of liquid tin.
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References
D.W. MacDonald and T.W. Eagar,Ann. Rev. Mater. Sci., 22 (1992), pp. 23–46.
G. Humpston and D.M. Jacobsen,Principles of Soldering and Brazing (Materials Park, OH: ASM, 1993), pp. 128–132.
R. Schmid-Fetzer,Design Fundamentals of High-Temperature Composites, Intermetallics and Metal-Ceramic Systems, ed. R.Y. Lin et al. (Warrendale, PA: TMS, 1995), pp. 75–97.
M.L. Shalz et al.,Cer. Trans. Amer. Cer. Soc., 35 (1993), pp. 301–322.
S.D. Peteves et al.,Acta mater., 46 (1998), pp. 2407–2414.
W.F. Gale, Y. Guan, and S.V. Orel,J. Mater. Prod. Technol., 13 (1998), pp. 1–12.
W. Xiaowei,J. Mater. Sci., 36 (2001), pp. 1539–1546.
H. Hieber, German patent DE 3,740,773 (A1/Erledigt 1991 [1989]).
G. Humpston et al.,GEC Rev., 7 (2) (1991), pp. 67–78.
F. Bartels, T. Muschik, and W. Gust,Verbindungstechnik in der Elektronik (Düsseldorf, Germany: DVS-Berichte, 1992), pp. 22–24.
C.C. Lee, C.Y. Wang, and G. Matijasevic,Trans. Comp., Hyb., Manufact. Technol., 16 (1993), pp. 311–316.
C. Bocking et al.,GEC J. Technol., 14 (1997), pp. 110–114.
P.K. Khanna, G. Dalke, and W. Gust,Z. Metallkd., 90 (9) (1999), pp. 722–726.
Ch. Kuper et al.,Z. Metallkd., 89 (1998), pp. 855–862.
T.B. Massalski et al. (eds.),Binary Alloy Phase Diagrams (Materials Park, OH: ASM, 1990).
C. Toffolon, C. Servant, and B. Sundman,J. Phase Equil., 19 (1998), pp. 479–485.
U. HÄusermann et al.,Chem. Eur. J., 4 (1998), pp. 1007–1015.
T. Studnitzky and R. Schmid-Fetzer,Z. Metallkd., 93 (2002), pp. 894–903.
T. Studnitzky and R. Schmid-Fetzer, submitted toJ. Electron. Mater. (2002)
W.S. Wong et al.,J. Electron. Mater., 28 (1999), pp. 1409–1413.
W.S. Wong et al.,Appl. Phys. Lett., 77 (2000), pp. 2822–2824.
W.S. Wong et al.,Mater. Res. Soc. Symp. Proc. 681 E (Warrendale, PA: MRS, 2001), pp. I6.1.1-I6.1.9.
N. Quitoriano et al.,J. Electron. Mater., 30 (2001), pp. 1471–1475.
ICDD Powder Diffraction File (Newtown Square, PA: International Center for Diffraction Data, 1998).
W. Kraus and G. Nolze,J. Appl. Crystals, 29 (1996), pp. 301–303.
W. Kraus and G. Nolze,PowderCell for Windows Version 2.3 (Berlin: Federal Institute for Materials Research and Testing, 1999).
P. Villars and L.D. Calvert,Pearson’s Handbook of Crystallographic Data for Intermetallic Phases (Material Park, OH, ASM, 1991).
T. Studnitzky and R. Schmid-Fetzer,Z. Metallkd. 93 (2002), 885–893.
T. Studnitzky, B. Onderka, and R. Schmid-Fetzer,Z. Metallkd., 93 (2002), pp. 48–57.
J.G. Lee et al.,Soldering and Surface Mount Technol., 14 (2002), pp. 11–17
K.C. Jain and S. Bhan,Trans. Indian Inst. Met., 25 (1972), pp. 100–102.
P. Guex and P. Feschotte,J. Less Common Metals, 46 (1976), pp. 101–116.
J. Jandova and D. Jakes,Kovove Mater., 26 (1) (1998), p. 38.
C.F. Lin, S.E. Mohney, and Y.A. Chang,J. Appl. Phys., 74 (7) (1993), p. 4398.
D. Swenson and Y.A. Chang,Mater. Sci. Eng. B, 22 (1994), p. 267.
L.H. Allen et al.,Appl. Phys. Lett., 51 (1987), pp. 326–327.
G. Stremsdoerfer et al.,J. Electrochem. Soc., 137 (1990), pp. 256–259.
H.G. Fu and T.S. Huang,Solid-State Electron., 38 (1995), pp. 89–94.
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Studnitzky, T., Schmid-Fetzer, R. Diffusion soldering for stable high-temperature thin-film bonds. JOM 54, 58–63 (2002). https://doi.org/10.1007/BF02709191
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DOI: https://doi.org/10.1007/BF02709191