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In situ accelerated leaching of cement paste by application of electrical fields monitored by synchrotron X-ray diffraction

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Abstract

An external dc voltage was applied to a cured cement paste to simulate its natural degradation as a function of time. The electrical treatment was monitored in situ by simultaneous acquisition of diffraction patterns every 10 min. The analysis of the diffraction patterns has confirmed that the microstructure of the whole paste changes during the treatment, with precipitation and dissolution of several phases. This work contributes to the understanding of the fundamentals of the microstructure alterations that take place upon application of an electrical field, allowing the establishment of a first approach to the understanding of the mechanism of these changes.

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Authors and Affiliations

  1. Institute of Construction Sciences “Eduardo Torroja”, CSIC, Madrid , Spain

    M. Castellote, X. Turrillas, C. Andrade & C. Alonso

  2. Institute of Ceramic and Glass, CSIC, Madrid, Spain

    M.A. Rodriguez

  3. European Synchrotron Radiation Facility (ESRF) Beam Line ID11, Grenoble, France

    . Kvick

Authors
  1. M. Castellote
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  2. X. Turrillas
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  3. C. Andrade
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  4. C. Alonso
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  5. M.A. Rodriguez
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  6. . Kvick
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Correspondence to M. Castellote.

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PACS

81.40.Cd; 82.80.Fk; 83.85.Hf

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Castellote, M., Turrillas, X., Andrade, C. et al. In situ accelerated leaching of cement paste by application of electrical fields monitored by synchrotron X-ray diffraction. Appl. Phys. A 79, 661–669 (2004). https://doi.org/10.1007/s00339-003-2076-x

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  • DOI: https://doi.org/10.1007/s00339-003-2076-x

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