Abstract
The dielectric properties of fresh and aged Ba(Zr0.25Ti0.75)O3 thin films have been investigated. It is found that the aged sample shows a significant decrease in the dielectric constant compared to the fresh one. Furthermore, the aged sample also exhibits abnormal double-peaks-shape butterfly C–V characteristics, which indicates the defect-dipole stabilized domain and/or domain-wall motions. Meanwhile, we found that double-peaks-shape butterfly C–V characteristics become weak and even disappear with increasing of applied electric field and temperature. The present results are discussed in light of the symmetry-conforming principle of point defects.
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Gao, C., Yang, J., Meng, X.J. et al. Aging-induced abnormality of dielectric response under dc bias in Ba(Zr, Ti)O3 thin films. Appl. Phys. A 104, 123–128 (2011). https://doi.org/10.1007/s00339-010-6076-3
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DOI: https://doi.org/10.1007/s00339-010-6076-3