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Dielectric relaxor behaviors and tunability of (1−x)Ba(Zr0.2Ti0.8)O3–x(Ba0.7Ca0.3)TiO3 thin films fabricated by sol–gel method

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Abstract

Temperature dependence of dielectric properties of (1−x)Ba(Zr0.2Ti0.8)O3–x(Ba0.7Ca0.3)TiO3 (x=0.15, 0.30, and 0.50) (BZT–xBCT) thin films prepared by a sol–gel method has been investigated. The results show that there is a broad dielectric maximum near T m and the diffuse parameter γ is close to 2, indicating a nearly complete diffuse phase transition in BZT–xBCT thin films. The dielectric relaxor behaviors of the thin films well follow Vogel–Fulcher relation. The thin films show a high dielectric tunability up to 65 %, with a small variation in the temperature range from 248.15 to 373.15 K. This study indicates that the thin films, especially for x=0.50, are promising candidates for tunable device applications with good temperature stability.

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Acknowledgements

The authors gratefully acknowledge support from NSFC (Grant Nos. 50872156 and 51172289) and China Postdoctoral Science Foundation (Grant No. 20110490970).

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Authors and Affiliations

  1. State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics and Engineering, Sun Yat-Sen University, Guangzhou, 510275, People’s Republic of China

    Yanting Lin, Ni Qin, Guangheng Wu, Tongliang Sa & Dinghua Bao

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  1. Yanting Lin
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  2. Ni Qin
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  3. Guangheng Wu
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  5. Dinghua Bao
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Correspondence to Dinghua Bao.

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Lin, Y., Qin, N., Wu, G. et al. Dielectric relaxor behaviors and tunability of (1−x)Ba(Zr0.2Ti0.8)O3–x(Ba0.7Ca0.3)TiO3 thin films fabricated by sol–gel method. Appl. Phys. A 109, 743–749 (2012). https://doi.org/10.1007/s00339-012-7110-4

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