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Structural, morphologic and optical characterization of In(2−x)Al x S3

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Abstract

Aluminum-doped indium sulfide thin films are deposited on glass by spray pyrolysis technique. The structure and the surface morphology of these films were characterized by X-ray diffraction and atomic force microscopy. The effects of aluminum ratio z and substrate temperature T s, on the film structure and grain size are discussed. The influence of aluminum ratio on surface morphology is revealed by scanning electron microscope. Besides, energy dispersive spectrometry technique is used to compare atomic aluminum concentration in the film with aluminum ratio z in spray solution. Optical properties are studied by a spectrophotometer in the wavelength range 350–850 nm, at room temperature. Optical transmission and grain size are found to be maximal for z = 1.8 %. Moreover, band-gap energy is found to increase with aluminum ratio.

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Acknowledgments

The authors wish to thank the Comité Mixte de Cooperation Universitaire for financial support under the project number 07S/1304 as well as Egide France under the Project Hubert Curien Utique number 07S/1304. We also would like to thank Dr Mohamed Mondher Jebari for the helpful discussion.

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Authors and Affiliations

  1. Laboratoire de Physique de la Matière Condensée, Faculté des Sciences de Tunis, Tunis El Manar, 2092, Tunis, Tunisia

    N. Jebbari, N. Kamoun Turki & R. Bennaceur

  2. Photothermal Laboratory of Nabeul, IPEIN, BP 62, Mrezka, 8000, Nabeul, Tunisia

    F. Saadallah & N. Yacoubi

  3. Institut Electronique du Sud, Université de Montpellier II, Place Eugène Bataillon, 34095, Montpellier Cedex 05, France

    C. Guasch

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  1. N. Jebbari
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  2. F. Saadallah
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  3. C. Guasch
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  4. N. Kamoun Turki
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  6. R. Bennaceur
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Correspondence to N. Jebbari.

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Jebbari, N., Saadallah, F., Guasch, C. et al. Structural, morphologic and optical characterization of In(2−x)Al x S3 . Appl. Phys. A 116, 2011–2017 (2014). https://doi.org/10.1007/s00339-014-8387-2

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