Abstract
We present a new method for detecting fractures in solid materials below the resolution given by the detector pixel size by using grating-based X-ray interferometry. The technique is particularly useful for detecting sub-pixel cracks in large samples where the size of the sample is preventing high-resolution μCT studies of the entire sample. The X-ray grating interferometer produces three distinct modality signals: absorption, phase and dark field. The method utilizes the unique scattering features of the dark-field signal. We have used tomograms reconstructed from each of the three signals to detect cracks in a model sample consisting of stearin.
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Acknowledgements
We acknowledge Maria Thomsen, Mikkel Schou Nielsen and Katrine R. Rosenmejer Nielsen (all from University of Copenhagen) for their help and assistance. We also thank the Danish Strategic Research Council for support from the NEXIM project and we also thank support from the CIA-CT project.
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Lauridsen, T., Willner, M., Bech, M. et al. Detection of sub-pixel fractures in X-ray dark-field tomography. Appl. Phys. A 121, 1243–1250 (2015). https://doi.org/10.1007/s00339-015-9496-2
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DOI: https://doi.org/10.1007/s00339-015-9496-2