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O2:H2O and HF:H2O. The analysis of the etched samples by scanning electron microscopy (SEM) and scanning probe microscopy (SPM) indicates that an array of square holes having well-defined patterned structures and clean substrate surfaces were obtained. The X-ray photoelectron spectroscopy (XPS) analysis indicates that the SiC samples etched by VUV-266 nm multiwavelength laser have a similar stoichiometry after chemical post-treatment as the virgin SiC. The mechanism of high-quality ablation using VUV-266 nm multiwavelength laser is discussed in comparison with ablation using 266 nm single wavelength. The chemical post-treatment contributes to removing the residues from the laser photolysis of SiC.
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Received: 26 August 1996/Accepted: 17 October 1996
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Zhang, J., Sugioka, K., Wada, S. et al. Direct photoetching of single crystal SiC by VUV-266 nm multiwavelength laser ablation . Appl Phys A 64, 367–371 (1997). https://doi.org/10.1007/s003390050492
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DOI: https://doi.org/10.1007/s003390050492