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Enhanced sensitivity to force gradients by using higher flexural modes of the atomic force microscope cantilever

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Received: 25 July 1997/Accepted: 1 October 1997

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Hoummady, M., Farnault, E. Enhanced sensitivity to force gradients by using higher flexural modes of the atomic force microscope cantilever . Appl Phys A 66 (Suppl 1), S361–S364 (1998). https://doi.org/10.1007/s003390051164

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  • DOI: https://doi.org/10.1007/s003390051164

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