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Pixel-based characterisation of CMOS high-speed camera systems

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Abstract

Quantifying high-repetition rate laser diagnostic techniques for measuring scalars in turbulent combustion relies on a complete description of the relationship between detected photons and the signal produced by the detector. CMOS-chip based cameras are becoming an accepted tool for capturing high frame rate cinematographic sequences for laser-based techniques such as Particle Image Velocimetry (PIV) and Planar Laser Induced Fluorescence (PLIF) and can be used with thermographic phosphors to determine surface temperatures. At low repetition rates, imaging techniques have benefitted from significant developments in the quality of CCD-based camera systems, particularly with the uniformity of pixel response and minimal non-linearities in the photon-to-signal conversion. The state of the art in CMOS technology displays a significant number of technical aspects that must be accounted for before these detectors can be used for quantitative diagnostics. This paper addresses these issues.

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Authors and Affiliations

  1. Fachgebiet Reaktive Strömungen und Messtechnik, Center of Smart Interfaces, Technische Universität Darmstadt, Petersenstraße 32, 64287, Darmstadt, Germany

    V. Weber, J. Brübach & A. Dreizler

  2. Hopkinson Laboratory, Department of Engineering, University of Cambridge, Trumpington Street, Cambridge, CB2 1PZ, UK

    R. L. Gordon

Authors
  1. V. Weber
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  2. J. Brübach
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  3. R. L. Gordon
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  4. A. Dreizler
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Correspondence to J. Brübach.

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Weber, V., Brübach, J., Gordon, R.L. et al. Pixel-based characterisation of CMOS high-speed camera systems. Appl. Phys. B 103, 421–433 (2011). https://doi.org/10.1007/s00340-011-4443-1

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  • DOI: https://doi.org/10.1007/s00340-011-4443-1

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