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Erschienen in: Acta Mechanica Sinica 2/2018

14.09.2017 | Review Paper

Micromechanics of substrate-supported thin films

verfasst von: Wei He, Meidong Han, Shibin Wang, Lin-An Li, Xiuli Xue

Erschienen in: Acta Mechanica Sinica | Ausgabe 2/2018

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Abstract

The mechanical properties of metallic thin films deposited on a substrate play a crucial role in the performance of micro/nano-electromechanical systems (MEMS/NEMS) and flexible electronics. This article reviews ongoing study on the mechanics of substrate-supported thin films, with emphasis on the experimental characterization techniques, such as the rule of mixture and X-ray tensile testing. In particular, the determination of interfacial adhesion energy, film deformation, elastic properties and Bauschinger effect are discussed.

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Literatur
1.
2.
Zurück zum Zitat Kim, D.-H., Xiao, J., Song, J., et al.: Stretchable, curvilinear electronics based on inorganic materials. Adv. Mater. 22, 2108–2124 (2010)CrossRef Kim, D.-H., Xiao, J., Song, J., et al.: Stretchable, curvilinear electronics based on inorganic materials. Adv. Mater. 22, 2108–2124 (2010)CrossRef
3.
Zurück zum Zitat Ko, H.C., Stoykovich, M.P., Song, J., et al.: A hemispherical electronic eye camera based on compressible silicon optoelectronics. Nature 454, 748–753 (2008)CrossRef Ko, H.C., Stoykovich, M.P., Song, J., et al.: A hemispherical electronic eye camera based on compressible silicon optoelectronics. Nature 454, 748–753 (2008)CrossRef
4.
Zurück zum Zitat Brand, J., Kok, M., Koetse, M., et al.: Flexible and stretchable electronics for wearable health devices. Solid-State Electron. 113, 116–120 (2015)CrossRef Brand, J., Kok, M., Koetse, M., et al.: Flexible and stretchable electronics for wearable health devices. Solid-State Electron. 113, 116–120 (2015)CrossRef
5.
Zurück zum Zitat Forrest, S.: The path to ubiquitous and low-cost organic electronic appliances on plastic. Nature 428, 911–918 (2004)CrossRef Forrest, S.: The path to ubiquitous and low-cost organic electronic appliances on plastic. Nature 428, 911–918 (2004)CrossRef
6.
Zurück zum Zitat Fewster, P.: X-ray analysis of thin films and multilayers. Rep. Prog. Phys. 59, 1339 (1996)CrossRef Fewster, P.: X-ray analysis of thin films and multilayers. Rep. Prog. Phys. 59, 1339 (1996)CrossRef
7.
Zurück zum Zitat Cotton, D., Graz, I., Lacour, S.: Stretchable touch sensitive keypad. Proc. Chem. 1, 152–155 (2009)CrossRef Cotton, D., Graz, I., Lacour, S.: Stretchable touch sensitive keypad. Proc. Chem. 1, 152–155 (2009)CrossRef
8.
Zurück zum Zitat Rogers, J., Someya, T., Huang, Y.: Materials and mechanics for stretchable electronics. Science 327, 1603–1607 (2010)CrossRef Rogers, J., Someya, T., Huang, Y.: Materials and mechanics for stretchable electronics. Science 327, 1603–1607 (2010)CrossRef
9.
Zurück zum Zitat Kim, D.-H., Ahn, J.-H., Choi, W.M., et al.: Stretchable and foldable silicon integrated circuits. Science 320, 507–511 (2008)CrossRef Kim, D.-H., Ahn, J.-H., Choi, W.M., et al.: Stretchable and foldable silicon integrated circuits. Science 320, 507–511 (2008)CrossRef
10.
Zurück zum Zitat Freund, L., Suresh, S.: Thin Film Materials: Stress, Defect Formation and Surface Evolution. Cambridge University Press, Cambridge (2004)MATHCrossRef Freund, L., Suresh, S.: Thin Film Materials: Stress, Defect Formation and Surface Evolution. Cambridge University Press, Cambridge (2004)MATHCrossRef
11.
Zurück zum Zitat Hohlfeld, E., Davidovitch, B.: Sheet on a deformable sphere: wrinkle patterns suppress curvature-induced delamination. Phys. Rev. E 91, 012407 (2015)CrossRef Hohlfeld, E., Davidovitch, B.: Sheet on a deformable sphere: wrinkle patterns suppress curvature-induced delamination. Phys. Rev. E 91, 012407 (2015)CrossRef
12.
Zurück zum Zitat Bella, P., Kohn, R.V.: Wrinkling of a thin circular sheet bonded to a spherical substrate. Philos. Trans. R. Soc. A 375, 2093 (2017)CrossRef Bella, P., Kohn, R.V.: Wrinkling of a thin circular sheet bonded to a spherical substrate. Philos. Trans. R. Soc. A 375, 2093 (2017)CrossRef
13.
Zurück zum Zitat Hure, J., Roman, B., Bico, J.: Stamping and wrinkling of elastic plates. Phys. Rev. Lett. 109, 054302 (2012)CrossRef Hure, J., Roman, B., Bico, J.: Stamping and wrinkling of elastic plates. Phys. Rev. Lett. 109, 054302 (2012)CrossRef
14.
Zurück zum Zitat Kim, D.-H., Song, J., Choi, W., et al.: Materials and noncoplanar mesh designs for integrated circuits with linear elastic responses to extreme mechanical deformations. Proc. Nat. Acad. Sci. 105, 18675–18680 (2008)CrossRef Kim, D.-H., Song, J., Choi, W., et al.: Materials and noncoplanar mesh designs for integrated circuits with linear elastic responses to extreme mechanical deformations. Proc. Nat. Acad. Sci. 105, 18675–18680 (2008)CrossRef
15.
Zurück zum Zitat Song, J., Feng, X., Huang, Y.: Mechanics and thermal management of stretchable inorganic electronics. Natl. Sci. Rev. 3, 128–143 (2016)CrossRef Song, J., Feng, X., Huang, Y.: Mechanics and thermal management of stretchable inorganic electronics. Natl. Sci. Rev. 3, 128–143 (2016)CrossRef
16.
Zurück zum Zitat Toth, F., Rammerstorfer, F., Cordill, M., et al.: Detailed modelling of delamination buckling of thin films under global tension. Acta Mater. 61, 2425–2433 (2013)CrossRef Toth, F., Rammerstorfer, F., Cordill, M., et al.: Detailed modelling of delamination buckling of thin films under global tension. Acta Mater. 61, 2425–2433 (2013)CrossRef
17.
Zurück zum Zitat Li, B., Cao, Y., Feng, X., et al.: Mechanics of morphological instabilities and surface wrinkling in soft materials: a review. Soft Matter 8, 5728–5745 (2012)CrossRef Li, B., Cao, Y., Feng, X., et al.: Mechanics of morphological instabilities and surface wrinkling in soft materials: a review. Soft Matter 8, 5728–5745 (2012)CrossRef
18.
Zurück zum Zitat Xue, X., Wang, S., Zeng, C., et al.: Buckling-delamination and cracking of thin titanium films under compression: experimental and numerical studies. Surf. Coat. Technol. 244, 151–157 (2014)CrossRef Xue, X., Wang, S., Zeng, C., et al.: Buckling-delamination and cracking of thin titanium films under compression: experimental and numerical studies. Surf. Coat. Technol. 244, 151–157 (2014)CrossRef
19.
Zurück zum Zitat Huang, H.S., Pei, H.J., Chang, Y.C., et al.: Tensile behaviors of amorphous-zrcu/nanocrystalline-cu multilayered thin film on polyimide substrate. Thin Solid Films 529, 177–180 (2013)CrossRef Huang, H.S., Pei, H.J., Chang, Y.C., et al.: Tensile behaviors of amorphous-zrcu/nanocrystalline-cu multilayered thin film on polyimide substrate. Thin Solid Films 529, 177–180 (2013)CrossRef
20.
Zurück zum Zitat Djaziri, S., Renault, P.-O., Le Bourhis, E., et al.: Comparative study of the mechanical properties of nanostructured thin films on stretchable substrates. J. Appl. Phys. 116, 093504 (2014)CrossRef Djaziri, S., Renault, P.-O., Le Bourhis, E., et al.: Comparative study of the mechanical properties of nanostructured thin films on stretchable substrates. J. Appl. Phys. 116, 093504 (2014)CrossRef
21.
Zurück zum Zitat Hommel, M., Kraft, O.: Deformation behavior of thin copper films on deformable substrates. Acta Mater. 49, 3935–3947 (2001)CrossRef Hommel, M., Kraft, O.: Deformation behavior of thin copper films on deformable substrates. Acta Mater. 49, 3935–3947 (2001)CrossRef
22.
Zurück zum Zitat Xiang, Y., Vlassak, J.: Bauschinger effect in thin metal films. Scr. Mater. 53, 177–182 (2005)CrossRef Xiang, Y., Vlassak, J.: Bauschinger effect in thin metal films. Scr. Mater. 53, 177–182 (2005)CrossRef
23.
Zurück zum Zitat Xiang, Y., Li, T., Suo, Z., et al.: High ductility of a metal film adherent on a polymer substrate. Appl. Phys. Lett. 87, 161910 (2005)CrossRef Xiang, Y., Li, T., Suo, Z., et al.: High ductility of a metal film adherent on a polymer substrate. Appl. Phys. Lett. 87, 161910 (2005)CrossRef
24.
Zurück zum Zitat Lu, N., Wang, X., Suo, Z., et al.: Metal films on polymer substrates stretched beyond 50%. Appl. Phys. Lett. 91, 221909 (2007)CrossRef Lu, N., Wang, X., Suo, Z., et al.: Metal films on polymer substrates stretched beyond 50%. Appl. Phys. Lett. 91, 221909 (2007)CrossRef
25.
Zurück zum Zitat Niu, R.M., Liu, G., Wang, C., et al.: Thickness dependent critical strain in submicron cu films adherent to polymer substrate. Appl. Phys. Lett. 90, 161907 (2007)CrossRef Niu, R.M., Liu, G., Wang, C., et al.: Thickness dependent critical strain in submicron cu films adherent to polymer substrate. Appl. Phys. Lett. 90, 161907 (2007)CrossRef
26.
Zurück zum Zitat Marx, V., Cordill, M., Tbbens, D., et al.: Effect of annealing on the size dependent deformation behavior of thin cobalt films on flexible substrates. Thin Solid Films 624, 34–40 (2017)CrossRef Marx, V., Cordill, M., Tbbens, D., et al.: Effect of annealing on the size dependent deformation behavior of thin cobalt films on flexible substrates. Thin Solid Films 624, 34–40 (2017)CrossRef
27.
Zurück zum Zitat Graudejus, O., Jia, Z., Li, T., et al.: Size-dependent rupture strain of elastically stretchable metal conductors. Scr. Mater. 66, 919 (2012)CrossRef Graudejus, O., Jia, Z., Li, T., et al.: Size-dependent rupture strain of elastically stretchable metal conductors. Scr. Mater. 66, 919 (2012)CrossRef
28.
Zurück zum Zitat Suo, Z., Vlassak, J.J., Wagner, S.: Micromechanics of macroelectronics. China Particuol. 3, 321–328 (2005)CrossRef Suo, Z., Vlassak, J.J., Wagner, S.: Micromechanics of macroelectronics. China Particuol. 3, 321–328 (2005)CrossRef
29.
Zurück zum Zitat Jia, H., Wang, S., Li, L., et al.: Application of optical 3d measurement on thin film buckling to estimate interfacial toughness. Opt. Lasers Eng. 54, 263–268 (2014)CrossRef Jia, H., Wang, S., Li, L., et al.: Application of optical 3d measurement on thin film buckling to estimate interfacial toughness. Opt. Lasers Eng. 54, 263–268 (2014)CrossRef
30.
Zurück zum Zitat Mittal, K.: Adhesion measurement of thin films. Act. Passive Electron. Compon. 3, 21–42 (1976) Mittal, K.: Adhesion measurement of thin films. Act. Passive Electron. Compon. 3, 21–42 (1976)
31.
Zurück zum Zitat Gerberich, W., Cordill, M.: Physics of adhesion. Rep. Prog. Phys. 69, 2157 (2006)CrossRef Gerberich, W., Cordill, M.: Physics of adhesion. Rep. Prog. Phys. 69, 2157 (2006)CrossRef
32.
Zurück zum Zitat Chen, J., Bull, S.: Indentation fracture and toughness assessment for thin optical coatings on glass. J. Phys. D Appl. Phys. 40, 5401 (2007)CrossRef Chen, J., Bull, S.: Indentation fracture and toughness assessment for thin optical coatings on glass. J. Phys. D Appl. Phys. 40, 5401 (2007)CrossRef
33.
Zurück zum Zitat Hutchinson, J.W., Suo, Z.: Mixed mode cracking in layered materials. Adv. Appl. Mech. 29, 63–191 (1991)MATHCrossRef Hutchinson, J.W., Suo, Z.: Mixed mode cracking in layered materials. Adv. Appl. Mech. 29, 63–191 (1991)MATHCrossRef
34.
Zurück zum Zitat Cordill, M., Fischer, F., Rammerstorfer, F., et al.: Adhesion energies of cr thin films on polyimide determined from buckling: experiment and model. Acta Mater. 58, 5520–5531 (2010) Cordill, M., Fischer, F., Rammerstorfer, F., et al.: Adhesion energies of cr thin films on polyimide determined from buckling: experiment and model. Acta Mater. 58, 5520–5531 (2010)
35.
Zurück zum Zitat Faurie, D., Zighem, F., Garcia-Sanchez, A., et al.: Fragmentation and adhesion properties of cofeb thin films on polyimide substrate. Appl. Phys. Lett. 110, 721 (2017)CrossRef Faurie, D., Zighem, F., Garcia-Sanchez, A., et al.: Fragmentation and adhesion properties of cofeb thin films on polyimide substrate. Appl. Phys. Lett. 110, 721 (2017)CrossRef
36.
Zurück zum Zitat Wu, K., Zhang, J.Y., Liu, G., et al.: Buckling behaviors and adhesion energy of nanostructured Cu/\(x\) (\(x\) = Nb, Zr) multilayer films on a compliant substrate. Acta Mater. 61, 7889 (2013)CrossRef Wu, K., Zhang, J.Y., Liu, G., et al.: Buckling behaviors and adhesion energy of nanostructured Cu/\(x\) (\(x\) = Nb, Zr) multilayer films on a compliant substrate. Acta Mater. 61, 7889 (2013)CrossRef
37.
Zurück zum Zitat Wu, D., Xie, H., Yin, Y., et al.: Micro-scale delaminating and buckling of thin film on soft substrate. J. Micromech. Microeng. 23, 03540 (2013) Wu, D., Xie, H., Yin, Y., et al.: Micro-scale delaminating and buckling of thin film on soft substrate. J. Micromech. Microeng. 23, 03540 (2013)
38.
Zurück zum Zitat Mohri, M., Nili-Ahmadabadi, M., PouryazdanPanah, M., et al.: Evaluation of structure and mechanical properties of Ni-rich NiTi/Kapton composite film. Mater. Sci. Eng. A 668, 13–19 (2016)CrossRef Mohri, M., Nili-Ahmadabadi, M., PouryazdanPanah, M., et al.: Evaluation of structure and mechanical properties of Ni-rich NiTi/Kapton composite film. Mater. Sci. Eng. A 668, 13–19 (2016)CrossRef
39.
Zurück zum Zitat Kirsch, B., Chen, X., Richman, E., et al.: Probing the effects of nanoscale architecture on the mechanical properties of hexagonal silica/polymer composite thin films. Adv. Funct. Mater. 15, 1319–1327 (2005)CrossRef Kirsch, B., Chen, X., Richman, E., et al.: Probing the effects of nanoscale architecture on the mechanical properties of hexagonal silica/polymer composite thin films. Adv. Funct. Mater. 15, 1319–1327 (2005)CrossRef
40.
Zurück zum Zitat Geandier, G., Renault, P.-O., Le Bourhis, E., et al.: Elastic-strain distribution in metallic film-polymer substrate composites. Appl. Phys. Lett. 96, 041905 (2010)CrossRef Geandier, G., Renault, P.-O., Le Bourhis, E., et al.: Elastic-strain distribution in metallic film-polymer substrate composites. Appl. Phys. Lett. 96, 041905 (2010)CrossRef
41.
Zurück zum Zitat Hommel, M., Kraft, O., Arzt, E.: A new method to study cyclic deformation of thin films in tension and compression. J. Mater. Res. 14, 2373–2376 (1999)CrossRef Hommel, M., Kraft, O., Arzt, E.: A new method to study cyclic deformation of thin films in tension and compression. J. Mater. Res. 14, 2373–2376 (1999)CrossRef
42.
Zurück zum Zitat Schadler, L., Noyan, I.C.: Experimental Determination of the Strain Transfer Across a Flexible Intermediate Layer in Thin Film Structures as a Function of Flexible Layer Thickness//MRS Proceedings. Cambridge University Press, Cambridge (1991) Schadler, L., Noyan, I.C.: Experimental Determination of the Strain Transfer Across a Flexible Intermediate Layer in Thin Film Structures as a Function of Flexible Layer Thickness//MRS Proceedings. Cambridge University Press, Cambridge (1991)
43.
Zurück zum Zitat Schadler, L., Noyan, I.: Experimental determination of the strain transfer across a flexible intermediate layer in thin-film structures. J. Mater. Sci. Lett. 11, 1067–1069 (1992)CrossRef Schadler, L., Noyan, I.: Experimental determination of the strain transfer across a flexible intermediate layer in thin-film structures. J. Mater. Sci. Lett. 11, 1067–1069 (1992)CrossRef
44.
Zurück zum Zitat Yin, H., Prieto-Munoz, P.: Stress transfer through fully bonded interface of layered materials. Mech. Mater. 62, 69–79 (2013)CrossRef Yin, H., Prieto-Munoz, P.: Stress transfer through fully bonded interface of layered materials. Mech. Mater. 62, 69–79 (2013)CrossRef
45.
Zurück zum Zitat Faurie, D., Renault, P.-O., Le Bourhis, E., et al.: Determination of elastic constants of a fiber-textured gold film by combining synchrotron X-ray diffraction and in situ tensile testing. J. Appl. Phys. 98, 093511 (2005)CrossRef Faurie, D., Renault, P.-O., Le Bourhis, E., et al.: Determination of elastic constants of a fiber-textured gold film by combining synchrotron X-ray diffraction and in situ tensile testing. J. Appl. Phys. 98, 093511 (2005)CrossRef
46.
Zurück zum Zitat Wojciechowski, P., Mendolia, M.: Fracture and cracking phenomena in thin films adhering to high-elongation substrates. Phys. Thin Films 16, 271–340 (1991)CrossRef Wojciechowski, P., Mendolia, M.: Fracture and cracking phenomena in thin films adhering to high-elongation substrates. Phys. Thin Films 16, 271–340 (1991)CrossRef
47.
Zurück zum Zitat Yanaka, M., Tsukahara, Y., Nakaso, N., et al.: Cracking phenomena of brittle films in nanostructure composites analysed by a modified shear lag model with residual strain. J. Mater. Sci. 33, 2111–2119 (1998)CrossRef Yanaka, M., Tsukahara, Y., Nakaso, N., et al.: Cracking phenomena of brittle films in nanostructure composites analysed by a modified shear lag model with residual strain. J. Mater. Sci. 33, 2111–2119 (1998)CrossRef
48.
Zurück zum Zitat Huang, H., Spaepen, F.: Tensile testing of free-standing Cu, Ag and Al thin films and Ag/Cu multilayers. Acta Mater. 48, 3261–3269 (2000)CrossRef Huang, H., Spaepen, F.: Tensile testing of free-standing Cu, Ag and Al thin films and Ag/Cu multilayers. Acta Mater. 48, 3261–3269 (2000)CrossRef
49.
Zurück zum Zitat Belrhiti, Y., Gallet-Doncieux, A., Germaneau, A., et al.: Application of optical methods to investigate the non-linear asymmetric behavior of ceramics exhibiting large strain to rupture by four-points bending test. J. Eur. Ceram. Soc. 32, 4073–4081 (2012)CrossRef Belrhiti, Y., Gallet-Doncieux, A., Germaneau, A., et al.: Application of optical methods to investigate the non-linear asymmetric behavior of ceramics exhibiting large strain to rupture by four-points bending test. J. Eur. Ceram. Soc. 32, 4073–4081 (2012)CrossRef
50.
Zurück zum Zitat Wu, D., Xie, H., Dai, X., et al.: A novel method to fabricate microgratings applied for deformation measurement around a crack in a thin film. Meas. Sci. Technol. 25, 025012 (2014)CrossRef Wu, D., Xie, H., Dai, X., et al.: A novel method to fabricate microgratings applied for deformation measurement around a crack in a thin film. Meas. Sci. Technol. 25, 025012 (2014)CrossRef
51.
Zurück zum Zitat Hild, F., Roux, S.: Digital image correlation: from displacement measurement to identification of elastic properties—a review. Strain 42, 69–80 (2006)CrossRef Hild, F., Roux, S.: Digital image correlation: from displacement measurement to identification of elastic properties—a review. Strain 42, 69–80 (2006)CrossRef
52.
Zurück zum Zitat Duprfie, J., Doumalin, P., Husseini, H., et al.: Displacement discontinuity or complex shape of sample: assessment of accuracy and adaptation of local dic approach. Strain 51, 391–404 (2015)CrossRef Duprfie, J., Doumalin, P., Husseini, H., et al.: Displacement discontinuity or complex shape of sample: assessment of accuracy and adaptation of local dic approach. Strain 51, 391–404 (2015)CrossRef
53.
Zurück zum Zitat Barranger, Y., Doumalin, P., Duprfie, J., et al.: Strain measurement by digital image correlation: influence of two types of speckle patterns made from rigid or deformable marks. Strain 48, 357–365 (2012)CrossRef Barranger, Y., Doumalin, P., Duprfie, J., et al.: Strain measurement by digital image correlation: influence of two types of speckle patterns made from rigid or deformable marks. Strain 48, 357–365 (2012)CrossRef
54.
Zurück zum Zitat Welzel, U., Ligot, J., Lamparter, P., et al.: Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction. J. Appl. Crystallogr. 38, 1–29 (2005)CrossRef Welzel, U., Ligot, J., Lamparter, P., et al.: Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction. J. Appl. Crystallogr. 38, 1–29 (2005)CrossRef
55.
Zurück zum Zitat Noyan, I., Huang, T., York, B.: Residual stress/strain analysis in thin films by X-ray difiraction. Crit. Rev. Solid State Mater. Sci. 20, 125–177 (1995)CrossRef Noyan, I., Huang, T., York, B.: Residual stress/strain analysis in thin films by X-ray difiraction. Crit. Rev. Solid State Mater. Sci. 20, 125–177 (1995)CrossRef
56.
Zurück zum Zitat Stoney, G.: The tension of metallic films deposited by electrolysis. Containing papers of a mathematical and physical character. Proc. R. Soc. Lond. Ser. A 82, 172–175 (1990)CrossRef Stoney, G.: The tension of metallic films deposited by electrolysis. Containing papers of a mathematical and physical character. Proc. R. Soc. Lond. Ser. A 82, 172–175 (1990)CrossRef
57.
Zurück zum Zitat Chou, T.-L., Yang, S.-Y., Chiang, K.-N.: Overview and applicability of residual stress estimation of film-substrate structure. Thin Solid Films 519, 7883–7894 (2011)CrossRef Chou, T.-L., Yang, S.-Y., Chiang, K.-N.: Overview and applicability of residual stress estimation of film-substrate structure. Thin Solid Films 519, 7883–7894 (2011)CrossRef
58.
Zurück zum Zitat Janssen, G., Abdalla, M., Van Keulen, F., et al.: Celebrating the 100th anniversary of the stoney equation for film stress: developments from polycrystalline steel strips to single crystal silicon wafers. Thin Solid Films 517, 1858–1867 (2009)CrossRef Janssen, G., Abdalla, M., Van Keulen, F., et al.: Celebrating the 100th anniversary of the stoney equation for film stress: developments from polycrystalline steel strips to single crystal silicon wafers. Thin Solid Films 517, 1858–1867 (2009)CrossRef
59.
Zurück zum Zitat Zhu, J., Xie, H., Hu, Z., et al.: Residual stress in thermal spray coatings measured by curvature based on 3d digital image correlation technique. Surf. Coat. Technol. 206, 1396–1402 (2011)CrossRef Zhu, J., Xie, H., Hu, Z., et al.: Residual stress in thermal spray coatings measured by curvature based on 3d digital image correlation technique. Surf. Coat. Technol. 206, 1396–1402 (2011)CrossRef
60.
Zurück zum Zitat Kim, C., Lee, T.-I., Kim, M., et al.: Warpage analysis of electroplated cu films on fiber-reinforced polymer packaging substrates. Polymers 7, 985–1004 (2015)CrossRef Kim, C., Lee, T.-I., Kim, M., et al.: Warpage analysis of electroplated cu films on fiber-reinforced polymer packaging substrates. Polymers 7, 985–1004 (2015)CrossRef
61.
Zurück zum Zitat Culity, B.: Elements of X-ray Diffraction. Addition-Wesley, London (1978) Culity, B.: Elements of X-ray Diffraction. Addition-Wesley, London (1978)
62.
Zurück zum Zitat Hauk, V.: Structural and Residual Stress Analysis by Nondestructive Methods: Evaluation-Application-Assessment. Elsevier, Amsterdam (1997)MATH Hauk, V.: Structural and Residual Stress Analysis by Nondestructive Methods: Evaluation-Application-Assessment. Elsevier, Amsterdam (1997)MATH
63.
Zurück zum Zitat Noyan, I., Cohen, J.: Residual Stress: Measurement by Diffraction and Interpretation. Springer, New York (1987)CrossRef Noyan, I., Cohen, J.: Residual Stress: Measurement by Diffraction and Interpretation. Springer, New York (1987)CrossRef
64.
Zurück zum Zitat Martinschitz, K., Daniel, R., Mitterer, C., et al.: Elastic constants of fibre-textured thin films determined by X-ray diffraction. J. Appl. Crystallogr. 42, 416–428 (2009)CrossRef Martinschitz, K., Daniel, R., Mitterer, C., et al.: Elastic constants of fibre-textured thin films determined by X-ray diffraction. J. Appl. Crystallogr. 42, 416–428 (2009)CrossRef
65.
Zurück zum Zitat Faurie, D., Castelnau, O., Brenner, R., et al.: In situ diffraction strain analysis of elastically deformed polycrystalline thin films, and micromechanical interpretation. J. Appl. Crystallogr. 42, 1073–1084 (2009)CrossRef Faurie, D., Castelnau, O., Brenner, R., et al.: In situ diffraction strain analysis of elastically deformed polycrystalline thin films, and micromechanical interpretation. J. Appl. Crystallogr. 42, 1073–1084 (2009)CrossRef
66.
Zurück zum Zitat Clemens, B., Bain, J.: Stress determination in textured thin films using X-ray diffraction. MRS Bull. 17, 46–51 (1992)CrossRef Clemens, B., Bain, J.: Stress determination in textured thin films using X-ray diffraction. MRS Bull. 17, 46–51 (1992)CrossRef
67.
Zurück zum Zitat Krottenthaler, M., Schmid, C., Schauer, J., et al.: A simple method for residual stress measurements in thin films by means of focused ion beam milling and digital image correlation. Surf. Coat. Technol. 215, 247–252 (2013)CrossRef Krottenthaler, M., Schmid, C., Schauer, J., et al.: A simple method for residual stress measurements in thin films by means of focused ion beam milling and digital image correlation. Surf. Coat. Technol. 215, 247–252 (2013)CrossRef
68.
Zurück zum Zitat Zhu, J.G., Xie, H.M., Li, Y.J., et al.: Interfacial residual stress analysis of thermal spray coatings by miniature ring-core cutting combined with DIC method. Exp. Mech. 54, 127–136 (2014)CrossRef Zhu, J.G., Xie, H.M., Li, Y.J., et al.: Interfacial residual stress analysis of thermal spray coatings by miniature ring-core cutting combined with DIC method. Exp. Mech. 54, 127–136 (2014)CrossRef
69.
Zurück zum Zitat Korsunsky, A., Sebastiani, M., Bemporad, E.: Focused ion beam ring drilling for residual stress evaluation. Mater. Lett. 63, 1961–1963 (2009)CrossRef Korsunsky, A., Sebastiani, M., Bemporad, E.: Focused ion beam ring drilling for residual stress evaluation. Mater. Lett. 63, 1961–1963 (2009)CrossRef
70.
Zurück zum Zitat Zhu, R.H., Xie, H.M., Zhu, J.G., et al.: A microscale strain rosette for residual stress measurement by SEM Moire method. Sci. China Phys. Mech. Astron. 57, 716–722 (2014)CrossRef Zhu, R.H., Xie, H.M., Zhu, J.G., et al.: A microscale strain rosette for residual stress measurement by SEM Moire method. Sci. China Phys. Mech. Astron. 57, 716–722 (2014)CrossRef
71.
Zurück zum Zitat Bemporad, E., Brisotto, M., Depero, L., et al.: A critical comparison between xrd and fib residual stress measurement techniques in thin films. Thin Solid Films 572, 224–231 (2014)CrossRef Bemporad, E., Brisotto, M., Depero, L., et al.: A critical comparison between xrd and fib residual stress measurement techniques in thin films. Thin Solid Films 572, 224–231 (2014)CrossRef
72.
Zurück zum Zitat Doerner, M.F., Nix, W.D.: Stresses and deformation processes in thin films on substrates. Crit. Rev. Solid State Mater. Sci. 14, 225–268 (1988)CrossRef Doerner, M.F., Nix, W.D.: Stresses and deformation processes in thin films on substrates. Crit. Rev. Solid State Mater. Sci. 14, 225–268 (1988)CrossRef
73.
Zurück zum Zitat Janssen, G.: Stress and strain in polycrystalline thin films. Thin Solid Films 515, 6654–6664 (2007)CrossRef Janssen, G.: Stress and strain in polycrystalline thin films. Thin Solid Films 515, 6654–6664 (2007)CrossRef
74.
Zurück zum Zitat Lu, N., Suo, Z., Vlassak, J.J.: The effect of film thickness on the failure strain of polymer-supported metal films. Acta Mater. 58, 1679–1687 (2010)CrossRef Lu, N., Suo, Z., Vlassak, J.J.: The effect of film thickness on the failure strain of polymer-supported metal films. Acta Mater. 58, 1679–1687 (2010)CrossRef
75.
Zurück zum Zitat Oliver, W., Pharr, G.: Measurement of hardness and elastic modulus by instrumented indentation: advances in understanding and refinements to methodology. J. Mater. Res. 19, 3–20 (2004)CrossRef Oliver, W., Pharr, G.: Measurement of hardness and elastic modulus by instrumented indentation: advances in understanding and refinements to methodology. J. Mater. Res. 19, 3–20 (2004)CrossRef
76.
Zurück zum Zitat Zhu, J.G., Xie, H.M., Hu, Z., et al.: Cross-sectional residual stresses in thermal spray coatings measured by Moire interferometry and nanoindentation technique. J. Therm. Spray Technol. 21, 810–817 (2012)CrossRef Zhu, J.G., Xie, H.M., Hu, Z., et al.: Cross-sectional residual stresses in thermal spray coatings measured by Moire interferometry and nanoindentation technique. J. Therm. Spray Technol. 21, 810–817 (2012)CrossRef
77.
Zurück zum Zitat Zhu, J.G., Wei, C., Xie, H.M.: Simulation of residual stresses and their effects on thermal barrier coating systems using finite element method. Sci. China Phys. Mech. Astron. 58, 1–10 (2015) Zhu, J.G., Wei, C., Xie, H.M.: Simulation of residual stresses and their effects on thermal barrier coating systems using finite element method. Sci. China Phys. Mech. Astron. 58, 1–10 (2015)
78.
Zurück zum Zitat Javed, H., Merle, B., Prei, E., et al.: Mechanical characterization of metallic thin films by bulge and scratch testing. Surf. Coat. Technol. 289, 69–74 (2016)CrossRef Javed, H., Merle, B., Prei, E., et al.: Mechanical characterization of metallic thin films by bulge and scratch testing. Surf. Coat. Technol. 289, 69–74 (2016)CrossRef
79.
Zurück zum Zitat Djaziri, S., Faurie, D., Renault, P.O., et al.: Yield surface of polycrystalline thin films as revealed by non-equibiaxial loadings at small deformation. Acta Mater. 61, 5067–5077 (2013)CrossRef Djaziri, S., Faurie, D., Renault, P.O., et al.: Yield surface of polycrystalline thin films as revealed by non-equibiaxial loadings at small deformation. Acta Mater. 61, 5067–5077 (2013)CrossRef
80.
Zurück zum Zitat Denis, Y., Spaepen, F.: The yield strength of thin copper films on kapton. J. Appl. Phys. 95, 2991–2997 (2004)CrossRef Denis, Y., Spaepen, F.: The yield strength of thin copper films on kapton. J. Appl. Phys. 95, 2991–2997 (2004)CrossRef
81.
Zurück zum Zitat Choi, Y., Lee, Y.-K.: Elastic modulus of amorphous Ge\(_2\)Sb\(_2\)Te\(_5\) thin film measured by uniaxial microtensile test. Electron. Mater. Lett. 6, 23–26 (2010)CrossRef Choi, Y., Lee, Y.-K.: Elastic modulus of amorphous Ge\(_2\)Sb\(_2\)Te\(_5\) thin film measured by uniaxial microtensile test. Electron. Mater. Lett. 6, 23–26 (2010)CrossRef
82.
Zurück zum Zitat Chen, X., Kirsch, B., Senter, R., et al.: Tensile testing of thin films supported on compliant substrates. Mech. Mater. 41, 839–848 (2009)CrossRef Chen, X., Kirsch, B., Senter, R., et al.: Tensile testing of thin films supported on compliant substrates. Mech. Mater. 41, 839–848 (2009)CrossRef
83.
Zurück zum Zitat He, W., Goudeau, P., Bourhis, E.L., et al.: Study on young’s modulus of thin films on kapton by microtensile testing combined with dual DIC system. Surf. Coat. Technol. 308, 273–279 (2016)CrossRef He, W., Goudeau, P., Bourhis, E.L., et al.: Study on young’s modulus of thin films on kapton by microtensile testing combined with dual DIC system. Surf. Coat. Technol. 308, 273–279 (2016)CrossRef
84.
Zurück zum Zitat Faurie, D., Renault, P.-O., Bourhis, E.Le, et al.: Study of texture effect on elastic properties of au thin films by X-ray diffraction and in situ tensile testing. Acta Mater. 54, 4503–4513 (2006)CrossRef Faurie, D., Renault, P.-O., Bourhis, E.Le, et al.: Study of texture effect on elastic properties of au thin films by X-ray diffraction and in situ tensile testing. Acta Mater. 54, 4503–4513 (2006)CrossRef
85.
Zurück zum Zitat Thomasov, M., Sedlk, P., Seiner, H., et al.: Youngs moduli of sputter-deposited niti films determined by resonant ultrasound spectroscopy: austenite, r-phase, and martensite. Scr. Mater. 101, 24–27 (2015)CrossRef Thomasov, M., Sedlk, P., Seiner, H., et al.: Youngs moduli of sputter-deposited niti films determined by resonant ultrasound spectroscopy: austenite, r-phase, and martensite. Scr. Mater. 101, 24–27 (2015)CrossRef
86.
Zurück zum Zitat Lpez-Puerto, A., Avils, F., Gamboa, F., et al.: A vibrational approach to determine the elastic modulus of individual thin films in multilayers. Thin Solid Films 565, 228–236 (2014)CrossRef Lpez-Puerto, A., Avils, F., Gamboa, F., et al.: A vibrational approach to determine the elastic modulus of individual thin films in multilayers. Thin Solid Films 565, 228–236 (2014)CrossRef
87.
Zurück zum Zitat Slima, M., Alhusseinb, A., Billard, A., et al.: On the determination of Young’s modulus of thin films with impulse excitation technique. J. Mater. Res. 32, 1–15 (2016) Slima, M., Alhusseinb, A., Billard, A., et al.: On the determination of Young’s modulus of thin films with impulse excitation technique. J. Mater. Res. 32, 1–15 (2016)
88.
Zurück zum Zitat Bauschinger, J.: Ueber die veranderung der elasticitatagrenze und der elasticitatamoduls verschiadener metalle. Zivilingenieur 27, 289–348 (1881) Bauschinger, J.: Ueber die veranderung der elasticitatagrenze und der elasticitatamoduls verschiadener metalle. Zivilingenieur 27, 289–348 (1881)
89.
Zurück zum Zitat Baker, S., Keller-Flaig, R.-M., et al.: Bauschinger effect and anomalous thermomechanical deformation induced by oxygen in passivated thin cu films on substrates. Acta Mater. 51, 3019–3036 (2003)CrossRef Baker, S., Keller-Flaig, R.-M., et al.: Bauschinger effect and anomalous thermomechanical deformation induced by oxygen in passivated thin cu films on substrates. Acta Mater. 51, 3019–3036 (2003)CrossRef
90.
Zurück zum Zitat Xiang, Y., Vlassak, J.J.: Bauschinger and size effects in thin-film plasticity. Acta Mater. 54, 5449–5460 (2006)CrossRef Xiang, Y., Vlassak, J.J.: Bauschinger and size effects in thin-film plasticity. Acta Mater. 54, 5449–5460 (2006)CrossRef
91.
Zurück zum Zitat Brugger, C., Coulombier, M., Massart, T., et al.: Strain gradient plasticity analysis of the strength and ductility of thin metallic films using an enriched interface model. Acta Mater. 58, 4940–4949 (2010)CrossRef Brugger, C., Coulombier, M., Massart, T., et al.: Strain gradient plasticity analysis of the strength and ductility of thin metallic films using an enriched interface model. Acta Mater. 58, 4940–4949 (2010)CrossRef
92.
Zurück zum Zitat Zhou, C., LeSar, R.: Dislocation dynamics simulations of the bauschinger effect in metallic thin films. Comput. Mater. Sci. 54, 350–355 (2012)CrossRef Zhou, C., LeSar, R.: Dislocation dynamics simulations of the bauschinger effect in metallic thin films. Comput. Mater. Sci. 54, 350–355 (2012)CrossRef
93.
Zurück zum Zitat Rajagopalan, J., Rentenberger, C., Karnthaler, H., et al.: In situ tem study of microplasticity and bauschinger effect in nanocrystalline metals. Acta Mater. 58, 4772–4782 (2010)CrossRef Rajagopalan, J., Rentenberger, C., Karnthaler, H., et al.: In situ tem study of microplasticity and bauschinger effect in nanocrystalline metals. Acta Mater. 58, 4772–4782 (2010)CrossRef
94.
Zurück zum Zitat Rajagopalan, J., Han, J., Saif, M.: Bauschinger effect in unpassivated freestanding nanoscale metal films. Scr. Mater. 59, 734–737 (2008)CrossRef Rajagopalan, J., Han, J., Saif, M.: Bauschinger effect in unpassivated freestanding nanoscale metal films. Scr. Mater. 59, 734–737 (2008)CrossRef
95.
Zurück zum Zitat Shishvan, S., Nicola, L.Van, der Giessen, E.: Bauschinger effect in unpassivated freestanding thin films. J. Appl. Phys. 107, 093529 (2010)CrossRef Shishvan, S., Nicola, L.Van, der Giessen, E.: Bauschinger effect in unpassivated freestanding thin films. J. Appl. Phys. 107, 093529 (2010)CrossRef
96.
Zurück zum Zitat Guruprasad, P., Carter, W., Benzerga, A.: A discrete dislocation analysis of the bauschinger effect in microcrystals. Acta Mater. 56, 5477–5491 (2008)CrossRef Guruprasad, P., Carter, W., Benzerga, A.: A discrete dislocation analysis of the bauschinger effect in microcrystals. Acta Mater. 56, 5477–5491 (2008)CrossRef
97.
Zurück zum Zitat Liu, Z.-L., Zhuang, Z., Liu, X.-M., et al.: Bauschinger and size effects in thin-film plasticity due to defect-energy of geometrical necessary dislocations. Acta. Mech. Sin. 27, 266–276 (2011)MathSciNetMATHCrossRef Liu, Z.-L., Zhuang, Z., Liu, X.-M., et al.: Bauschinger and size effects in thin-film plasticity due to defect-energy of geometrical necessary dislocations. Acta. Mech. Sin. 27, 266–276 (2011)MathSciNetMATHCrossRef
98.
Zurück zum Zitat Davoudi, K., Nicola, L., Vlassak, J.J.: Bauschinger effect in thin metal films: discrete dislocation dynamics study. J. Appl. Phys. 115, 013507 (2014)CrossRef Davoudi, K., Nicola, L., Vlassak, J.J.: Bauschinger effect in thin metal films: discrete dislocation dynamics study. J. Appl. Phys. 115, 013507 (2014)CrossRef
99.
Zurück zum Zitat Xu, S., Yan, Z., Jang, K.-I., et al.: Assembly of micro/nanomaterials into complex, three-dimensional architectures by compressive buckling. Science 347, 154–159 (2015)CrossRef Xu, S., Yan, Z., Jang, K.-I., et al.: Assembly of micro/nanomaterials into complex, three-dimensional architectures by compressive buckling. Science 347, 154–159 (2015)CrossRef
100.
Zurück zum Zitat Song, J., Jiang, H., Liu, Z., et al.: Buckling of a stiff thin film on a compliant substrate in large deformation. Int. J. Solids Struct. 45, 3107–3121 (2008)MATHCrossRef Song, J., Jiang, H., Liu, Z., et al.: Buckling of a stiff thin film on a compliant substrate in large deformation. Int. J. Solids Struct. 45, 3107–3121 (2008)MATHCrossRef
101.
Zurück zum Zitat Khang, D.-Y., Jiang, H., Huang, Y., et al.: A stretchable form of single crystal silicon for high-performance electronics on rubber substrates. Science 311, 208–212 (2006)CrossRef Khang, D.-Y., Jiang, H., Huang, Y., et al.: A stretchable form of single crystal silicon for high-performance electronics on rubber substrates. Science 311, 208–212 (2006)CrossRef
102.
Zurück zum Zitat Renault, P.-O., Faurie, D., Le Bourhis, E., et al.: Deposition of ultra-thin gold film on in situ loaded polymeric substrate for compression tests. Mater. Lett. 73, 99–102 (2012)CrossRef Renault, P.-O., Faurie, D., Le Bourhis, E., et al.: Deposition of ultra-thin gold film on in situ loaded polymeric substrate for compression tests. Mater. Lett. 73, 99–102 (2012)CrossRef
103.
Zurück zum Zitat Faurie, D., Renault, P.-O., Le Bourhis, E., et al.: X-ray elastic strain analysis of compressed au thin film on polymer substrate. Surf. Coat. Technol. 215, 322–326 (2013)CrossRef Faurie, D., Renault, P.-O., Le Bourhis, E., et al.: X-ray elastic strain analysis of compressed au thin film on polymer substrate. Surf. Coat. Technol. 215, 322–326 (2013)CrossRef
104.
Zurück zum Zitat He, W., Renault, P.-O., Le Bourhis, E., et al.: Cyclic testing of thin Ni films on a pre-tensile compliant substrate. Mater. Sci. Eng. A 695, 112–119 (2017)CrossRef He, W., Renault, P.-O., Le Bourhis, E., et al.: Cyclic testing of thin Ni films on a pre-tensile compliant substrate. Mater. Sci. Eng. A 695, 112–119 (2017)CrossRef
Metadaten
Titel
Micromechanics of substrate-supported thin films
verfasst von
Wei He
Meidong Han
Shibin Wang
Lin-An Li
Xiuli Xue
Publikationsdatum
14.09.2017
Verlag
The Chinese Society of Theoretical and Applied Mechanics; Institute of Mechanics, Chinese Academy of Sciences
Erschienen in
Acta Mechanica Sinica / Ausgabe 2/2018
Print ISSN: 0567-7718
Elektronische ISSN: 1614-3116
DOI
https://doi.org/10.1007/s10409-017-0697-0

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