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Erschienen in: Journal of Computational Electronics 3/2013

01.09.2013

Time-resolved electron transport with quantum trajectories

verfasst von: G. Albareda, D. Marian, A. Benali, S. Yaro, N. Zanghì, X. Oriols

Erschienen in: Journal of Computational Electronics | Ausgabe 3/2013

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Abstract

It is shown that Bohmian mechanics applied to describe electron transport in open systems (in terms of waves and particles) leads to a quantum-trajectory Monte Carlo algorithm where randomness appears because of the uncertainties in the number of electrons, their energies and the initial positions of the trajectories. The usefulness of this formalism to provide predictions beyond DC, namely AC regime, transient and noise, in nanoelectronic devices, is proven and discussed in detail. In particular, we emphasize the ability of this formalism to provide a straightforward answer to the measurement of the total current and its advantages to deal with the many-body problem in electron transport scenarios. All the results presented along the manuscript have been obtained using the electron device simulator BITLLES.

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Fußnoten
1
BITLLES is the acronym of Bohmian Interacting Transport for non-equiLibrium eLEctronic Structures. See the website http://​europe.​uab.​es/​bitlles.
 
2
In a flat potential region without interaction, the single-particle wave packet is exactly the normalized conditional (Bohmian) wave function discussed in this work.
 
3
In a practical procedure, we cannot select an infinite number of electrons. Then, we select a number of them large enough so that the mean current remains practically unchanged if the number of electrons is increased.
 
4
Most of electronic apparatuses, and the ammeter itself, have to be interpreted as low-pass filters. Therefore, they are not able to measure all noise of the spectrum, but only up to a maximum cut-off frequency.
 
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Metadaten
Titel
Time-resolved electron transport with quantum trajectories
verfasst von
G. Albareda
D. Marian
A. Benali
S. Yaro
N. Zanghì
X. Oriols
Publikationsdatum
01.09.2013
Verlag
Springer US
Erschienen in
Journal of Computational Electronics / Ausgabe 3/2013
Print ISSN: 1569-8025
Elektronische ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-013-0484-5

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