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Erschienen in: Journal of Computational Electronics 2/2015

01.06.2015

Monte Carlo simulation of hot carrier transport in III-N LEDs

verfasst von: Pyry Kivisaari, Jani Oksanen, Jukka Tulkki, Toufik Sadi

Erschienen in: Journal of Computational Electronics | Ausgabe 2/2015

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Abstract

Recent measurements aiming to resolve the origin of the efficiency droop in III-Nitride (III-N) light-emitting diodes (LEDs) have given invaluable information on the phenomenon and reinforced the interest for detailed device-level simulations. We have developed a microscopic device-level Monte Carlo model of electronic transport in III-N multi-quantum well (MQW) LEDs to analyze their operation in more detail and to increase the understanding of hot electrons generated by Auger recombination and electron overflow. In this work we apply the model to simulate the LED structure studied experimentally by Lin et al. (IEEE Photonics Technol Lett 24(18):1600, 2012) to compare the results to predictions given by the widely used drift-diffusion model and to investigate the relationship between the efficiency droop, Auger recombination, and the transport of hot electrons. To evaluate the reliability of the results and to enable comparison to other works, we also study how some of the most important uncertainties in the material parameters affect the results. In particular, we study how changing the polarization charges, properties of p-type GaN, and the sidevalley energy offset of the conduction band within the range reported in recent literature affects the results. Based on the results we discuss the difficulty to fit device-level models to measurements of the efficiency droop and the incomplete understanding of current transport in III-N MQW structures that might be limiting the development of next-generation optoelectronic devices.

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Literatur
1.
Zurück zum Zitat Pimputkar, S., Speck, J.S., DenBaars, S.P., Nakamura, S.: Prospects for LED lighting. Nat. Photonics 3, 180–182 (2009)CrossRef Pimputkar, S., Speck, J.S., DenBaars, S.P., Nakamura, S.: Prospects for LED lighting. Nat. Photonics 3, 180–182 (2009)CrossRef
2.
Zurück zum Zitat Nakamura, S., Krames, M.R.: History of gallium-nitride-based light-emitting diodes for illumination. Proc. IEEE 101, 2211–2220 (2013)CrossRef Nakamura, S., Krames, M.R.: History of gallium-nitride-based light-emitting diodes for illumination. Proc. IEEE 101, 2211–2220 (2013)CrossRef
3.
Zurück zum Zitat Seong, T.-Y., Han, J., Amano, H., Morkoc, H.: History of gallium-nitride-based light-emitting diodes for illumination. Springer, Berlin (2013) Seong, T.-Y., Han, J., Amano, H., Morkoc, H.: History of gallium-nitride-based light-emitting diodes for illumination. Springer, Berlin (2013)
4.
Zurück zum Zitat Cao, L., White, J.S., Park, J.-S., Schuller, J.A., Clemens, B.M., Brongersma, M.L.: Engineering light absorption in semiconductor nanowire devices. Nat. Mater. 8, 643–647 (2009)CrossRef Cao, L., White, J.S., Park, J.-S., Schuller, J.A., Clemens, B.M., Brongersma, M.L.: Engineering light absorption in semiconductor nanowire devices. Nat. Mater. 8, 643–647 (2009)CrossRef
5.
Zurück zum Zitat Wallentin, J., Anttu, N., Asoli, D., Huffman, M., Åberg, I., Magnusson, M.H., Siefer, G., Fuss-Kailuweit, P., Dimroth, F., Witzigmann, B., Xu, H.Q., Samuelson, L., Deppert, K., Borgström, M.T.: InP nanowire array solar cells achieving 13.8 % efficiency by exceeding the ray optics limit. Science 339, 1057–1060 (2013)CrossRef Wallentin, J., Anttu, N., Asoli, D., Huffman, M., Åberg, I., Magnusson, M.H., Siefer, G., Fuss-Kailuweit, P., Dimroth, F., Witzigmann, B., Xu, H.Q., Samuelson, L., Deppert, K., Borgström, M.T.: InP nanowire array solar cells achieving 13.8 % efficiency by exceeding the ray optics limit. Science 339, 1057–1060 (2013)CrossRef
6.
Zurück zum Zitat Bayerl, D., Kioupakis, E.: Visible-wavelength polarized-light emission with small-diameter InN nanowires. Nano Lett. 14(7), 3709–3714 (2014)CrossRef Bayerl, D., Kioupakis, E.: Visible-wavelength polarized-light emission with small-diameter InN nanowires. Nano Lett. 14(7), 3709–3714 (2014)CrossRef
7.
Zurück zum Zitat Kivisaari, P., Oksanen, J., Tulkki, J.: Current Injection to free-standing III-N nanowires by bipolar diffusion. Appl. Phys. Lett. 103, 031103 (2013)CrossRef Kivisaari, P., Oksanen, J., Tulkki, J.: Current Injection to free-standing III-N nanowires by bipolar diffusion. Appl. Phys. Lett. 103, 031103 (2013)CrossRef
8.
Zurück zum Zitat Riuttanen, L., Kivisaari, P., Nykänen, H., Svensk, O., Suihkonen, S., Oksanen, J., Tulkki, J., Sopanen, M.: Diffusion injected multi-quantum well light-emitting diode structure. Appl. Phys. Lett. 104, 081102 (2014)CrossRef Riuttanen, L., Kivisaari, P., Nykänen, H., Svensk, O., Suihkonen, S., Oksanen, J., Tulkki, J., Sopanen, M.: Diffusion injected multi-quantum well light-emitting diode structure. Appl. Phys. Lett. 104, 081102 (2014)CrossRef
9.
Zurück zum Zitat Barnes, W.L., Dereux, A., Ebbesen, T.W.: Surface plasmon subwavelength optics. Nature 424, 824–830 (2003)CrossRef Barnes, W.L., Dereux, A., Ebbesen, T.W.: Surface plasmon subwavelength optics. Nature 424, 824–830 (2003)CrossRef
10.
Zurück zum Zitat Okamoto, K., Niki, I., Shvartser, A., Narukawa, Y., Mukai, T., Scherer, A.: Surface-plasmon-enhanced light emitters based on InGaN quantum wells. Nat. Mater. 3, 601–605 (2004)CrossRef Okamoto, K., Niki, I., Shvartser, A., Narukawa, Y., Mukai, T., Scherer, A.: Surface-plasmon-enhanced light emitters based on InGaN quantum wells. Nat. Mater. 3, 601–605 (2004)CrossRef
11.
Zurück zum Zitat Yeh, D.-M., Huang, C.-F., Chen, C.-Y., Lu, Y.-C., Yang, C.C.: Localized surface plasmon-induced emission enhancement of a green light-emitting diode. Nanotechnology 19, 345201 (2008)CrossRef Yeh, D.-M., Huang, C.-F., Chen, C.-Y., Lu, Y.-C., Yang, C.C.: Localized surface plasmon-induced emission enhancement of a green light-emitting diode. Nanotechnology 19, 345201 (2008)CrossRef
12.
Zurück zum Zitat Oulton, R.F., Sorger, V.J., Zentgraf, T., Ma, R.-M., Gladden, C., Dai, L., Bartal, G., Zhang, X.: Plasmon lasers at deep subwavelength scale. Nature 461, 629–632 (2009)CrossRef Oulton, R.F., Sorger, V.J., Zentgraf, T., Ma, R.-M., Gladden, C., Dai, L., Bartal, G., Zhang, X.: Plasmon lasers at deep subwavelength scale. Nature 461, 629–632 (2009)CrossRef
13.
Zurück zum Zitat Sorger, V.J., Zhang, X.: Spotlight on plasmon lasers. Science 333, 709–710 (2011)CrossRef Sorger, V.J., Zhang, X.: Spotlight on plasmon lasers. Science 333, 709–710 (2011)CrossRef
14.
Zurück zum Zitat Homeyer, E., Mattila, P., Oksanen, J., Sadi, T., Nykänen, H., Suihkonen, S., Symonds, C., Tulkki, J., Tuomisto, F., Sopanen, M., Bellessa, J.: Enhanced light extraction from InGaN/GaN quantum wells with silver gratings. Appl. Phys. Lett. 102, 081110 (2013)CrossRef Homeyer, E., Mattila, P., Oksanen, J., Sadi, T., Nykänen, H., Suihkonen, S., Symonds, C., Tulkki, J., Tuomisto, F., Sopanen, M., Bellessa, J.: Enhanced light extraction from InGaN/GaN quantum wells with silver gratings. Appl. Phys. Lett. 102, 081110 (2013)CrossRef
15.
Zurück zum Zitat Sadi, T., Oksanen, J., Tulkki, J., Mattila, P., Bellessa, J.: The green’s function description of emission enhancement in grated LED structures. IEEE. J. Sel. Top. Quant. Electr. 19(5), 7800209 (2013)CrossRef Sadi, T., Oksanen, J., Tulkki, J., Mattila, P., Bellessa, J.: The green’s function description of emission enhancement in grated LED structures. IEEE. J. Sel. Top. Quant. Electr. 19(5), 7800209 (2013)CrossRef
16.
Zurück zum Zitat Wierer Jr, J.J., David, A., Megens, M.M.: III-Nitride photonic-crystal light-emitting diodes with high extraction efficiency. Nat. Photonics 3, 163–169 (2009)CrossRef Wierer Jr, J.J., David, A., Megens, M.M.: III-Nitride photonic-crystal light-emitting diodes with high extraction efficiency. Nat. Photonics 3, 163–169 (2009)CrossRef
17.
Zurück zum Zitat Shirasaki, Y., Supran, G.J., Bawendi, M.G., Bulović, V.: Emergence of colloidal quantum-dot light-emitting technologies. Nat. Photonics 7, 13–23 (2013)CrossRef Shirasaki, Y., Supran, G.J., Bawendi, M.G., Bulović, V.: Emergence of colloidal quantum-dot light-emitting technologies. Nat. Photonics 7, 13–23 (2013)CrossRef
18.
Zurück zum Zitat Piprek, J.: Efficiency droop in nitride-based light-emitting diodes. Phys. Status Solidi A 207(10), 2217–2225 (2010)CrossRef Piprek, J.: Efficiency droop in nitride-based light-emitting diodes. Phys. Status Solidi A 207(10), 2217–2225 (2010)CrossRef
19.
Zurück zum Zitat Iveland, J., Martinelli, L., Peretti, J., Speck, J.S., Weisbuch, C.: Direct measurement of auger electrons emitted from a semiconductor light-emitting diode under electrical injection: identification of the dominant mechanism for efficiency droop. Phys. Rev. Lett. 110, 177406 (2013)CrossRef Iveland, J., Martinelli, L., Peretti, J., Speck, J.S., Weisbuch, C.: Direct measurement of auger electrons emitted from a semiconductor light-emitting diode under electrical injection: identification of the dominant mechanism for efficiency droop. Phys. Rev. Lett. 110, 177406 (2013)CrossRef
20.
Zurück zum Zitat Iveland, J., Piccardo, M., Martinelli, L., Peretti, J., Choi, J.W., Young, N., Nakamura, S., Speck, J.S., Weisbuch, C.: Origin of electrons emitted into vacuum from InGaN light emitting diodes. Appl. Phys. Lett. 105, 052103 (2014)CrossRef Iveland, J., Piccardo, M., Martinelli, L., Peretti, J., Choi, J.W., Young, N., Nakamura, S., Speck, J.S., Weisbuch, C.: Origin of electrons emitted into vacuum from InGaN light emitting diodes. Appl. Phys. Lett. 105, 052103 (2014)CrossRef
21.
Zurück zum Zitat Binder, M., Nirschl, A., Zeisel, R., Hager, T., Lugauer, H.-J., Sabathil, M., Bougeard, D., Wagner, J., Galler, B.: Identification of nnp and npp Auger recombination as significant contributor to the efficiency droop in (GaIn)N quantum wells by visualization of hot carriers in photoluminescence. Appl. Phys. Lett. 103, 071108 (2013)CrossRef Binder, M., Nirschl, A., Zeisel, R., Hager, T., Lugauer, H.-J., Sabathil, M., Bougeard, D., Wagner, J., Galler, B.: Identification of nnp and npp Auger recombination as significant contributor to the efficiency droop in (GaIn)N quantum wells by visualization of hot carriers in photoluminescence. Appl. Phys. Lett. 103, 071108 (2013)CrossRef
22.
Zurück zum Zitat Bertazzi, F., Goano, M., Zhou, X., Calciati, M., Ghione, G., Matsubara, M.,Bellotti, E.: Comment on “Direct measurement of auger electrons emitted from a semiconductor light-emitting diode under electrical injection: identification of the dominant mechanism for efficiency droop”. [Phys. Rev. Lett. 110, 177406 (2013)]. arXiv: 1305.2512 (2013) Bertazzi, F., Goano, M., Zhou, X., Calciati, M., Ghione, G., Matsubara, M.,Bellotti, E.: Comment on “Direct measurement of auger electrons emitted from a semiconductor light-emitting diode under electrical injection: identification of the dominant mechanism for efficiency droop”. [Phys. Rev. Lett. 110, 177406 (2013)]. arXiv:​ 1305.​2512 (2013)
23.
Zurück zum Zitat Hader, J., Moloney, J.V., Koch, S.W.: Microscopic many-body investigation of the efficiency droop in GaN based light emitting devices. Proc. SPIE 9003, 900311 (2014)CrossRef Hader, J., Moloney, J.V., Koch, S.W.: Microscopic many-body investigation of the efficiency droop in GaN based light emitting devices. Proc. SPIE 9003, 900311 (2014)CrossRef
24.
Zurück zum Zitat Sadi, T., Kivisaari, P., Oksanen, J., Tulkki, J.: On the correlation of the Auger generated hot electron emission and efficiency droop in III-N light-emitting diodes. Appl. Phys. Lett. 105, 091106 (2014)CrossRef Sadi, T., Kivisaari, P., Oksanen, J., Tulkki, J.: On the correlation of the Auger generated hot electron emission and efficiency droop in III-N light-emitting diodes. Appl. Phys. Lett. 105, 091106 (2014)CrossRef
25.
Zurück zum Zitat Kivisaari, P., Sadi, T., Oksanen, J., Tulkki, J.: Monte Carlo-drift-diffusion simulation of electron current transport in III-N LEDs. Proc. SPIE 8980, 898003 (2014)CrossRef Kivisaari, P., Sadi, T., Oksanen, J., Tulkki, J.: Monte Carlo-drift-diffusion simulation of electron current transport in III-N LEDs. Proc. SPIE 8980, 898003 (2014)CrossRef
26.
Zurück zum Zitat Sadi, T., Kivisaari, P., Oksanen, J., Tulkki, J.: Microscopic simulation of hot electron transport in III-N light-emitting diodes. Opt. Quant. Electron. (2014, accepted) Sadi, T., Kivisaari, P., Oksanen, J., Tulkki, J.: Microscopic simulation of hot electron transport in III-N light-emitting diodes. Opt. Quant. Electron. (2014, accepted)
27.
Zurück zum Zitat Piprek, J.: LED droop: a critical review and novel solution. Compd. Semicond. 20, 44–48 (2014) Piprek, J.: LED droop: a critical review and novel solution. Compd. Semicond. 20, 44–48 (2014)
28.
Zurück zum Zitat Lin, Y.-Y., Chuang, R.W., Chang, S.-J., Li, S., Jiao, Z.-Y., Ko, T.-K., Hon, S.J., Liu, C.H.: GaN-based LEDs with a chirped multiquantum barrier structure. IEEE Photonics Technol. Lett. 24(18), 1600–1602 (2012)CrossRef Lin, Y.-Y., Chuang, R.W., Chang, S.-J., Li, S., Jiao, Z.-Y., Ko, T.-K., Hon, S.J., Liu, C.H.: GaN-based LEDs with a chirped multiquantum barrier structure. IEEE Photonics Technol. Lett. 24(18), 1600–1602 (2012)CrossRef
29.
Zurück zum Zitat Piprek, J., Li, Z.M.S.: Origin of InGaN light-emitting diode efficiency improvements using chirped AlGaN multi-quantum barriers. Appl. Phys. Lett. 102, 023510 (2013)CrossRef Piprek, J., Li, Z.M.S.: Origin of InGaN light-emitting diode efficiency improvements using chirped AlGaN multi-quantum barriers. Appl. Phys. Lett. 102, 023510 (2013)CrossRef
30.
Zurück zum Zitat Wang, R., Ruden, P.P., Kolnik, J., Oguzman, I., Brennan, K.F.: Dielectric properties of wurtzite and zincblende gallium nitride. J. Phys. Chem. Solids 58, 913 (1997)CrossRef Wang, R., Ruden, P.P., Kolnik, J., Oguzman, I., Brennan, K.F.: Dielectric properties of wurtzite and zincblende gallium nitride. J. Phys. Chem. Solids 58, 913 (1997)CrossRef
31.
Zurück zum Zitat Albrecht, J.D., Wang, R.P., Ruden, P.P., Farahmand, M., Brennan, K.F.: Electron transport characteristics of GaN for high temperature device modeling. J. Appl. Phys. 83, 4777–4781 (1998)CrossRef Albrecht, J.D., Wang, R.P., Ruden, P.P., Farahmand, M., Brennan, K.F.: Electron transport characteristics of GaN for high temperature device modeling. J. Appl. Phys. 83, 4777–4781 (1998)CrossRef
32.
Zurück zum Zitat Delaney, K.T., Rinke, P., Van de Walle, C.G.: Auger recombination rates in nitrides from first principles. Appl. Phys. Lett. 94, 191109 (2009)CrossRef Delaney, K.T., Rinke, P., Van de Walle, C.G.: Auger recombination rates in nitrides from first principles. Appl. Phys. Lett. 94, 191109 (2009)CrossRef
33.
Zurück zum Zitat de Carvalho, L.C., Schleife, A., Bechstedt, F.: Influence of exchange and correlation on structural and electronic properties of AlN, GaN, and InN polytypes. Phys. Rev. B 84, 195105 (2011)CrossRef de Carvalho, L.C., Schleife, A., Bechstedt, F.: Influence of exchange and correlation on structural and electronic properties of AlN, GaN, and InN polytypes. Phys. Rev. B 84, 195105 (2011)CrossRef
34.
Zurück zum Zitat Wu, S., Geiser, P., Jun, J., Karpinski, J., Wang, D., Sobolewski, R.: Time-resolved intervalley transitions in GaN single crystals. J. Appl. Phys. 101, 043701 (2007)CrossRef Wu, S., Geiser, P., Jun, J., Karpinski, J., Wang, D., Sobolewski, R.: Time-resolved intervalley transitions in GaN single crystals. J. Appl. Phys. 101, 043701 (2007)CrossRef
35.
Zurück zum Zitat Piccardo, M., Martinelli, L., Iveland, J., Young, N., DenBaars, S.P., Nakamura, S., Speck, J.S., Weisbuch, C., Peretti, J.: Determination of the first satellite valley energy in the conduction band of wurtzite GaN by near-band-gap photoemission spectroscopy. Phys. Rev. B 89, 235124 (2014)CrossRef Piccardo, M., Martinelli, L., Iveland, J., Young, N., DenBaars, S.P., Nakamura, S., Speck, J.S., Weisbuch, C., Peretti, J.: Determination of the first satellite valley energy in the conduction band of wurtzite GaN by near-band-gap photoemission spectroscopy. Phys. Rev. B 89, 235124 (2014)CrossRef
36.
Zurück zum Zitat Feneberg, M., Romero, M.F., Röppischer, M., Cobet, C., Esser, N., Neuschl, B., Thonke, K., Bickermann, M., Goldhahn, R.: Anisotropic absorption and emission of bulk (\(1\overline{1}00\)) AlN. Phys. Rev. B 87, 235209 (2013)CrossRef Feneberg, M., Romero, M.F., Röppischer, M., Cobet, C., Esser, N., Neuschl, B., Thonke, K., Bickermann, M., Goldhahn, R.: Anisotropic absorption and emission of bulk (\(1\overline{1}00\)) AlN. Phys. Rev. B 87, 235209 (2013)CrossRef
37.
Zurück zum Zitat Zhang, H., Miller, E.J., Yu, E.T., Poblenz, C., Speck, J.S.: Measurement of polarization charge and conduction-band offset at In\(_x\)Ga\(_{1-x}\)N/GaN heterojunction interfaces. Appl. Phys. Lett. 84, 4644 (2004)CrossRef Zhang, H., Miller, E.J., Yu, E.T., Poblenz, C., Speck, J.S.: Measurement of polarization charge and conduction-band offset at In\(_x\)Ga\(_{1-x}\)N/GaN heterojunction interfaces. Appl. Phys. Lett. 84, 4644 (2004)CrossRef
38.
Zurück zum Zitat Fiorentini, V., Bernardini, F., Ambacher, O.: Evidence for nonlinear macroscopic polarization in IIIV nitride alloy heterostructures. Appl. Phys. Lett. 80, 1204 (2002)CrossRef Fiorentini, V., Bernardini, F., Ambacher, O.: Evidence for nonlinear macroscopic polarization in IIIV nitride alloy heterostructures. Appl. Phys. Lett. 80, 1204 (2002)CrossRef
39.
Zurück zum Zitat Yan, W.S., Zhang, R., Xie, Z.L., Xiu, X.Q., Han, P., Lu, H., Chen, P., Gu, S.L., Shi, Y., Zheng, Y.D., Liu, Z.G.: A thermodynamic model and estimation of the experimental value of spontaneous polarization in a wurtzite GaN. Appl. Phys. Lett. 94, 042106 (2009)CrossRef Yan, W.S., Zhang, R., Xie, Z.L., Xiu, X.Q., Han, P., Lu, H., Chen, P., Gu, S.L., Shi, Y., Zheng, Y.D., Liu, Z.G.: A thermodynamic model and estimation of the experimental value of spontaneous polarization in a wurtzite GaN. Appl. Phys. Lett. 94, 042106 (2009)CrossRef
40.
Zurück zum Zitat Kivisaari, P., Sadi, T., Oksanen, J., Tulkki, J.: Bipolar Monte Carlo simulation of electrons and holes in III-N LEDs. Proc. SPIE 9363, 93631S (2015) Kivisaari, P., Sadi, T., Oksanen, J., Tulkki, J.: Bipolar Monte Carlo simulation of electrons and holes in III-N LEDs. Proc. SPIE 9363, 93631S (2015)
41.
Zurück zum Zitat Kivisaari, P., Oksanen, J., Tulkki, J.: Effects of lateral current injection in GaN multi-quantum well light-emitting diodes. J. Appl. Phys. 111, 103120 (2012)CrossRef Kivisaari, P., Oksanen, J., Tulkki, J.: Effects of lateral current injection in GaN multi-quantum well light-emitting diodes. J. Appl. Phys. 111, 103120 (2012)CrossRef
42.
Zurück zum Zitat Bulashevich, K.A., Mymrin, V.F., Karpov, S., Zu, Z.A.I., Zhmakin, I.A.: Simulation of visible and ultra-violet group-III nitride light emitting diodes. J. Comput. Phys. 213(1), 214–238 (2006)CrossRefMATH Bulashevich, K.A., Mymrin, V.F., Karpov, S., Zu, Z.A.I., Zhmakin, I.A.: Simulation of visible and ultra-violet group-III nitride light emitting diodes. J. Comput. Phys. 213(1), 214–238 (2006)CrossRefMATH
43.
Zurück zum Zitat Piprek, J., Li, S.: GaN-based light-emitting diodes. In: Piprek, J. (ed.) Optoelectronic Devices: Advanced Simulation and Analysis. Springer, New York (2005)CrossRef Piprek, J., Li, S.: GaN-based light-emitting diodes. In: Piprek, J. (ed.) Optoelectronic Devices: Advanced Simulation and Analysis. Springer, New York (2005)CrossRef
44.
Zurück zum Zitat Piprek, J., Li, S.: Electron leakage effects on GaN-based light-emitting diodes. Opt. Quant. Electron 42(2), 89–95 (2010)CrossRef Piprek, J., Li, S.: Electron leakage effects on GaN-based light-emitting diodes. Opt. Quant. Electron 42(2), 89–95 (2010)CrossRef
45.
Zurück zum Zitat Levinshtein, M.E., Rumyantsev, S.L., Shur, M.S.: Properties of Advanced Semiconductor Materials. Wiley, New York (2001) Levinshtein, M.E., Rumyantsev, S.L., Shur, M.S.: Properties of Advanced Semiconductor Materials. Wiley, New York (2001)
46.
Zurück zum Zitat Karpov, S.Y.: Visible light-emitting diodes. In: Piprek, J. (ed.) Nitride Semiconductor Devices. Wiley, New York (2007) Karpov, S.Y.: Visible light-emitting diodes. In: Piprek, J. (ed.) Nitride Semiconductor Devices. Wiley, New York (2007)
47.
Zurück zum Zitat Bellotti, E., Bertazzi, F.: Transport parameters for electrons and holes. In: Piprek, J. (ed.) Nitride Semiconductor Devices. Wiley, New York (2007) Bellotti, E., Bertazzi, F.: Transport parameters for electrons and holes. In: Piprek, J. (ed.) Nitride Semiconductor Devices. Wiley, New York (2007)
48.
Zurück zum Zitat Kivisaari, P., Oksanen, J., Tulkki, J.: Polarization doping and the efficiency of III-nitride optoelectronic devices. Appl. Phys. Lett. 103, 211118 (2013)CrossRef Kivisaari, P., Oksanen, J., Tulkki, J.: Polarization doping and the efficiency of III-nitride optoelectronic devices. Appl. Phys. Lett. 103, 211118 (2013)CrossRef
49.
Zurück zum Zitat Brennan, K.F.: The Physics of Semiconductors with Applications to Optoelectronic Devices. Cambridge University Press, Cambridge (1999) Brennan, K.F.: The Physics of Semiconductors with Applications to Optoelectronic Devices. Cambridge University Press, Cambridge (1999)
50.
Zurück zum Zitat Jacoboni, C., Reggiani, L.: The Monte Carlo method for the solution of charge transport in semiconductors with applications to covalent materials. Rev. Mod. Phys. 55, 645–705 (1983)CrossRef Jacoboni, C., Reggiani, L.: The Monte Carlo method for the solution of charge transport in semiconductors with applications to covalent materials. Rev. Mod. Phys. 55, 645–705 (1983)CrossRef
51.
Zurück zum Zitat Jacoboni, C., Lugli, P.: The Monte Carlo Method for Semiconductor Device Simulation. Springer, Wien (1989)CrossRef Jacoboni, C., Lugli, P.: The Monte Carlo Method for Semiconductor Device Simulation. Springer, Wien (1989)CrossRef
52.
Zurück zum Zitat Sadi, T., Kelsall, R.W., Pilgrim, N.J.: Investigation of self-heating effects in submicrometer GaN/AlGaN HEMTs using an electrothermal Monte Carlo method. IEEE Trans. Electr. Dev. 53(12), 2892–2900 (2006)CrossRef Sadi, T., Kelsall, R.W., Pilgrim, N.J.: Investigation of self-heating effects in submicrometer GaN/AlGaN HEMTs using an electrothermal Monte Carlo method. IEEE Trans. Electr. Dev. 53(12), 2892–2900 (2006)CrossRef
53.
Zurück zum Zitat Sadi, T., Kelsall, R.W.: Hot-phonon effect on the electrothermal behavior of submicrometer III-V HEMTs. IEEE Electr. Dev. Lett. 28(9), 787–789 (2007)CrossRef Sadi, T., Kelsall, R.W.: Hot-phonon effect on the electrothermal behavior of submicrometer III-V HEMTs. IEEE Electr. Dev. Lett. 28(9), 787–789 (2007)CrossRef
54.
Zurück zum Zitat Sadi, T., Kelsall, R.W.: Theoretical study of electron confinement in submicrometer GaN HFETs using a thermally self-consistent Monte Carlo method. IEEE Trans. Electr. Dev. 55(4), 945–953 (2008)CrossRef Sadi, T., Kelsall, R.W.: Theoretical study of electron confinement in submicrometer GaN HFETs using a thermally self-consistent Monte Carlo method. IEEE Trans. Electr. Dev. 55(4), 945–953 (2008)CrossRef
55.
Zurück zum Zitat Sadi, T., Kelsall, R.W., Pilgrim, N.J., Thobel, J.-L., Dessenne, F.: Monte Carlo study of self-heating in nanoscale devices. J. Comput. Electron. 11(1), 118–128 (2012)CrossRef Sadi, T., Kelsall, R.W., Pilgrim, N.J., Thobel, J.-L., Dessenne, F.: Monte Carlo study of self-heating in nanoscale devices. J. Comput. Electron. 11(1), 118–128 (2012)CrossRef
56.
Zurück zum Zitat Ridley, B.K.: Quantum Processes in Semiconductors. Clarendon Press, Oxford (1999) Ridley, B.K.: Quantum Processes in Semiconductors. Clarendon Press, Oxford (1999)
57.
Zurück zum Zitat Schroeder, D.: Boundary and interface conditions of transport equations for device simulation. Adv. Solid State Phys. 36, 265–283 (1996)CrossRef Schroeder, D.: Boundary and interface conditions of transport equations for device simulation. Adv. Solid State Phys. 36, 265–283 (1996)CrossRef
58.
Zurück zum Zitat Shockley, W., Read, J.W.T.: Statistics of the recombinations of holes and electrons. Phys. Rev. 87, 835–842 (1952)CrossRefMATH Shockley, W., Read, J.W.T.: Statistics of the recombinations of holes and electrons. Phys. Rev. 87, 835–842 (1952)CrossRefMATH
59.
Zurück zum Zitat Hall, R.N.: Electron-hole recombination in Germanium. Phys. Rev. 87, 387 (1952)CrossRef Hall, R.N.: Electron-hole recombination in Germanium. Phys. Rev. 87, 387 (1952)CrossRef
60.
Zurück zum Zitat Heikkilä, O., Oksanen, J., Tulkki, J.: Ultimate limit and temperature dependency of light-emitting diode efficiency. J. Appl. Phys. 105, 093119 (2009)CrossRef Heikkilä, O., Oksanen, J., Tulkki, J.: Ultimate limit and temperature dependency of light-emitting diode efficiency. J. Appl. Phys. 105, 093119 (2009)CrossRef
61.
Zurück zum Zitat Singh, J.: Semiconductor Devices: An Introduction. McGraw-Hill, Inc, New York (1994) Singh, J.: Semiconductor Devices: An Introduction. McGraw-Hill, Inc, New York (1994)
62.
Zurück zum Zitat Haug, A.: Phonon-assisted Auger recombination in quantum well semiconductors. Appl. Phys. A 51, 354–356 (1990)CrossRef Haug, A.: Phonon-assisted Auger recombination in quantum well semiconductors. Appl. Phys. A 51, 354–356 (1990)CrossRef
63.
Zurück zum Zitat Deppner, M., Römer, F., Witzigmann, B.: Auger carrier leakage in III-nitride quantum-well light emitting diodes. Phys. Status Solidi RRL 6(11), 418–420 (2012)CrossRef Deppner, M., Römer, F., Witzigmann, B.: Auger carrier leakage in III-nitride quantum-well light emitting diodes. Phys. Status Solidi RRL 6(11), 418–420 (2012)CrossRef
64.
Zurück zum Zitat Verzellesi, G., Saguatti, D., Meneghini, M., Bertazzi, F., Goano, M., Meneghesso, G., Zanoni, E.: Efficiency droop in InGaN/GaN blue light-emitting diodes: physical mechanisms and remedies. J. Appl. Phys. 114, 071101 (2013)CrossRef Verzellesi, G., Saguatti, D., Meneghini, M., Bertazzi, F., Goano, M., Meneghesso, G., Zanoni, E.: Efficiency droop in InGaN/GaN blue light-emitting diodes: physical mechanisms and remedies. J. Appl. Phys. 114, 071101 (2013)CrossRef
65.
Zurück zum Zitat Kivisaari, P., Riuttanen, L., Oksanen, J., Suihkonen, S., Ali, M., Lipsanen, H., Tulkki, J.: Electrical measurement of internal quantum efficiency and extraction efficiency of III-N light-emitting diodes. Appl. Phys. Lett. 101, 021113 (2012)CrossRef Kivisaari, P., Riuttanen, L., Oksanen, J., Suihkonen, S., Ali, M., Lipsanen, H., Tulkki, J.: Electrical measurement of internal quantum efficiency and extraction efficiency of III-N light-emitting diodes. Appl. Phys. Lett. 101, 021113 (2012)CrossRef
66.
Zurück zum Zitat Schiavon, D., Binder, M., Peter, M., Galler, B., Drechsel, P., Scholz, F.: Wavelength-dependent determination of the recombination rate coefficients in single-quantum-well GaInN/GaN light emitting diodes. Phys. Status Solidi B 250, 283–290 (2013)CrossRef Schiavon, D., Binder, M., Peter, M., Galler, B., Drechsel, P., Scholz, F.: Wavelength-dependent determination of the recombination rate coefficients in single-quantum-well GaInN/GaN light emitting diodes. Phys. Status Solidi B 250, 283–290 (2013)CrossRef
67.
Zurück zum Zitat Kioupakis, E., Rinke, P., Delaney, K.T., Van de Walle, C.G.: Indirect Auger recombination as a cause of efficiency droop in nitride light-emitting diodes. Appl. Phys. Lett. 98, 161107 (2011)CrossRef Kioupakis, E., Rinke, P., Delaney, K.T., Van de Walle, C.G.: Indirect Auger recombination as a cause of efficiency droop in nitride light-emitting diodes. Appl. Phys. Lett. 98, 161107 (2011)CrossRef
68.
Zurück zum Zitat Bertazzi, F., Goano, M., Bellotti, E.: Numerical analysis of indirect Auger transitions in InGaN. Appl. Phys. Lett. 101, 011111 (2012)CrossRef Bertazzi, F., Goano, M., Bellotti, E.: Numerical analysis of indirect Auger transitions in InGaN. Appl. Phys. Lett. 101, 011111 (2012)CrossRef
69.
Zurück zum Zitat Kuo, Y.-K., Horng, S.-H., Yen, S.-H., Tsai, M.-C., Huang, M.-F.: Effect of polarization state on optical properties of blue-violet InGaN light-emitting diodes. Appl. Phys. A 98(3), 509–515 (2010)CrossRef Kuo, Y.-K., Horng, S.-H., Yen, S.-H., Tsai, M.-C., Huang, M.-F.: Effect of polarization state on optical properties of blue-violet InGaN light-emitting diodes. Appl. Phys. A 98(3), 509–515 (2010)CrossRef
Metadaten
Titel
Monte Carlo simulation of hot carrier transport in III-N LEDs
verfasst von
Pyry Kivisaari
Jani Oksanen
Jukka Tulkki
Toufik Sadi
Publikationsdatum
01.06.2015
Verlag
Springer US
Erschienen in
Journal of Computational Electronics / Ausgabe 2/2015
Print ISSN: 1569-8025
Elektronische ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-015-0687-z

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