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Journal of Materials Science
Erschienen in: Journal of Materials Science 1/2019

20.08.2018 | Ceramics

Thickness dependence of photoresponsive properties at SrTiO3-based oxide heterointerfaces under different strains

verfasst von: Hong Yan, Zhaoting Zhang, Shuanhu Wang, Lixia Ren, Ming Li, Changle Chen, Kexin Jin

Erschienen in: Journal of Materials Science | Ausgabe 1/2019

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Abstract

The photoresponsive characteristics of SrTiO3-based oxide heterointerfaces at different thicknesses and strains are investigated. In addition to the typical persistent photoconductivity, the transient photoconductivity is observed at the heterointerfaces below the critical thickness. More intriguingly, it shows a transition from the transient photoconductivity to the persistent photoconductivity for the interfaces at the critical thickness with enhancing temperatures, which is related to the dominant role of thermal energy. Moreover, larger strain at the LaAlO3/SrTiO3 interfaces produces a roughly greater photoinduced change in the resistance than the strain-relaxed (La0.3Sr0.7)(Al0.65Ta0.35)O3/SrTiO3 interfaces. Our results provide deeper insight into the photoresponsive properties and intrinsic mechanisms of two-dimensional electron gas at complex oxide interfaces.
Vorheriger Artikel Reclamation of tungsten from carbide scraps and spent materials
Nächster Artikel Lamellar and bundled domain rotations in barium titanate

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Metadaten
Titel
Thickness dependence of photoresponsive properties at SrTiO3-based oxide heterointerfaces under different strains
verfasst von
Hong Yan
Zhaoting Zhang
Shuanhu Wang
Lixia Ren
Ming Li
Changle Chen
Kexin Jin
Publikationsdatum
20.08.2018
Verlag
Springer US
Erschienen in
Journal of Materials Science / Ausgabe 1/2019
Print ISSN: 0022-2461
Elektronische ISSN: 1573-4803
DOI
https://doi.org/10.1007/s10853-018-2823-1

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