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Erschienen in: Journal of Materials Science: Materials in Electronics 7/2010

01.07.2010

Effects of trace rare earth Nd addition on microstructure and properties of SnAgCu solder

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 7/2010

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Abstract

Effects of rare earth Nd on solderability of the Sn3.8Ag0.7Cu alloy were studied by wetting balance method, and the mechanical properties (such as pull-force and shear-force) of the joints soldered with SnAgCu–XNd solders were determined using STR-1000 joint strength tester. Moreover, the microstructures of SnAgCu–XNd solders bearing different amount of Nd as well as the intermetallic compounds (IMCs) formed at solder/Cu interface during soldering have been investigated using optical microscopy, scanning electron microscopy and energy dispersive X-ray analysis, respectively. The results indicate that trace amount of Nd addition can remarkably improve the solderability and mechanical properties of SnAgCu solder. At the same time, it is found that rare earth Nd in SnAgCu solder could refine and improve microstructure of the solder, some bigger IMC plates in SnAgCu solder were replaced by fine granular IMCs. Moreover, the thickness of the intermetallic layer at the Cu/solder interface was reduced significantly. In summary, we suggest that the most suitable content of rare earth Nd is about 0.05 wt% and it will be inadvisable when the Nd exceeds 0.25 wt%.

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Metadaten
Titel
Effects of trace rare earth Nd addition on microstructure and properties of SnAgCu solder
Publikationsdatum
01.07.2010
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 7/2010
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-009-9970-8

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