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On the dynamics of tapping mode atomic force microscope probes

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Abstract

A mathematical model is developed to investigate the grazing dynamics of tapping mode atomic force microscopes (AFM) subjected to a base harmonic excitation. A multimode Galerkin approximation is utilized to discretize the nonlinear partial differential equation of motion governing the cantilever response and associated boundary conditions and obtain a set of nonlinearly coupled ordinary differential equations governing the time evolution of the system dynamics. A comprehensive numerical analysis is performed for a wide range of the excitation amplitude and frequency. The tip oscillations are examined using nonlinear dynamic tools through several examples. The non-smoothness in the tip/sample interaction model is treated rigorously. A higher-mode Galerkin analysis indicates that period doubling bifurcations and chaotic vibrations are possible in tapping mode microscopy for certain operating parameters. It is also found that a single-mode Galerkin approximation, which accurately predicts the tip nonlinear responses far from the sample, is not adequate for predicting all of the nonlinear phenomena exhibited by an AFM, such as grazing bifurcations, and leads to both quantitative and qualitative errors.

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Authors and Affiliations

  1. Department of Engineering Science and Mechanics, Virginia Polytechnic Institute and State University, MC 0219, Blacksburg, VA, 24061, USA

    Arash Bahrami & Ali H. Nayfeh

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  1. Arash Bahrami
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  2. Ali H. Nayfeh
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Correspondence to Arash Bahrami.

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Bahrami, A., Nayfeh, A.H. On the dynamics of tapping mode atomic force microscope probes. Nonlinear Dyn 70, 1605–1617 (2012). https://doi.org/10.1007/s11071-012-0560-6

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  • DOI: https://doi.org/10.1007/s11071-012-0560-6

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