Skip to main content
Erschienen in: Optical and Quantum Electronics 5/2015

01.05.2015

Influence of temperature on the performance of high power AlGaInP based red light emitting diode

verfasst von: Pradip Dalapati, Nabin Baran Manik, Asok Nath Basu

Erschienen in: Optical and Quantum Electronics | Ausgabe 5/2015

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

The high power light emitting diode (LED) based on AlGaInP is tested on line at temperatures from 350 to 77 K. The experimental data are fitted to measure the relationship between temperature and the ideality factor, the forward voltage, the relative light intensity emitted by the LED, the carrier lifetime and the reverse recovery time of the device. These results show that temperature has a significant influence on different properties of such LED. Finally, it is important to note that an optimization among the different parameter values, while some increasing and others decreasing with temperature change, as indicated in the present study, is essential and must be considered for design involving the device, particularly, for any low temperature application.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literatur
Zurück zum Zitat Acharya, Y.B., Vyavahare, P.D.: Temperature characteristics of the device constant (n) of a light emitting diode. Solid State Electron. 43, 645–647 (1999)CrossRefADS Acharya, Y.B., Vyavahare, P.D.: Temperature characteristics of the device constant (n) of a light emitting diode. Solid State Electron. 43, 645–647 (1999)CrossRefADS
Zurück zum Zitat Bergman, J.P., Hallin, C., Janzhn, E.: Temperature dependence of the minority carrier, lifetime in GaAs/AIGaAs double heterostructures. J. Appl. Phys. 78, 4808–4810 (1995)CrossRefADS Bergman, J.P., Hallin, C., Janzhn, E.: Temperature dependence of the minority carrier, lifetime in GaAs/AIGaAs double heterostructures. J. Appl. Phys. 78, 4808–4810 (1995)CrossRefADS
Zurück zum Zitat Bhattacharya, D.K., Abhai, M., Swarup, P.: Determination of recombination center position from the temperature dependence of minority carrier lifetime in the base region of pn junction solar cells. J. Appl. Phys. 57, 2942–2947 (1985)CrossRefADS Bhattacharya, D.K., Abhai, M., Swarup, P.: Determination of recombination center position from the temperature dependence of minority carrier lifetime in the base region of pn junction solar cells. J. Appl. Phys. 57, 2942–2947 (1985)CrossRefADS
Zurück zum Zitat Bolotnikov, A.V., Muzykov, P.G., Grekov, A.E., Sudarshan, T.S.: Improvement of 4H-SiC power p-i-n diode switching performance through local lifetime control using boron diffusion. IEEE Trans. Electron Devices 54, 1540–1544 (2007)CrossRefADS Bolotnikov, A.V., Muzykov, P.G., Grekov, A.E., Sudarshan, T.S.: Improvement of 4H-SiC power p-i-n diode switching performance through local lifetime control using boron diffusion. IEEE Trans. Electron Devices 54, 1540–1544 (2007)CrossRefADS
Zurück zum Zitat Chand, S., Kumar, J.: On the existence of a distribution of barrier heights in Pd2Si/Si Schottky diodes. J. Appl. Phys. 80, 288–294 (1996)CrossRefADS Chand, S., Kumar, J.: On the existence of a distribution of barrier heights in Pd2Si/Si Schottky diodes. J. Appl. Phys. 80, 288–294 (1996)CrossRefADS
Zurück zum Zitat Chen, F.P., Zhang, Y.M., Zhang, Y.M., Tang, X.Y., Wang, Y.H., Chen, W.H.: Temperature-dependent characteristics of 4H SiC junction barrier Schottky diodes. Chin. Phys. B 21, 037304–037308 (2012)CrossRefADS Chen, F.P., Zhang, Y.M., Zhang, Y.M., Tang, X.Y., Wang, Y.H., Chen, W.H.: Temperature-dependent characteristics of 4H SiC junction barrier Schottky diodes. Chin. Phys. B 21, 037304–037308 (2012)CrossRefADS
Zurück zum Zitat Dalapati, P., Manik, N.B., Basu, A.N.: Effect of temperature on the intensity and carrier lifetime of an AlGaAs based red light emitting diode. J. Semicond. 34, 092001–092005 (2013)CrossRefADS Dalapati, P., Manik, N.B., Basu, A.N.: Effect of temperature on the intensity and carrier lifetime of an AlGaAs based red light emitting diode. J. Semicond. 34, 092001–092005 (2013)CrossRefADS
Zurück zum Zitat Hull, B.A., Sumakeris, J.J., O’Loughlin, M.J., Zhang, Q., Richmond, J., Powell, A.R., Imhoff, E.A., Hobart, K.D., Rivera-Lopez, A., Hefner, A.R.: Performance and stability of large-area 4H-SiC10-kV junction barrier Schottky rectifiers. IEEE Trans. Electron Devices 55, 1864–1870 (2008) Hull, B.A., Sumakeris, J.J., O’Loughlin, M.J., Zhang, Q., Richmond, J., Powell, A.R., Imhoff, E.A., Hobart, K.D., Rivera-Lopez, A., Hefner, A.R.: Performance and stability of large-area 4H-SiC10-kV junction barrier Schottky rectifiers. IEEE Trans. Electron Devices 55, 1864–1870 (2008)
Zurück zum Zitat Keserlioglu, M.S., Erkaya, H.H.: Simulation of storage time versus reverse bias current for p\(^{+}\)n and pin diodes. Turk. J. Electr. Eng. Comput. Sci. 19, 87–96 (2011) Keserlioglu, M.S., Erkaya, H.H.: Simulation of storage time versus reverse bias current for p\(^{+}\)n and pin diodes. Turk. J. Electr. Eng. Comput. Sci. 19, 87–96 (2011)
Zurück zum Zitat Kim, M.S., Lee, H.K., Yu, J.S.: Device characteristics and thermal analysis of AlGaInP-based red monolithic light- emitting diode arrays. Semicond. Sci. Technol. 28, 025005–025012 (2013)CrossRefADS Kim, M.S., Lee, H.K., Yu, J.S.: Device characteristics and thermal analysis of AlGaInP-based red monolithic light- emitting diode arrays. Semicond. Sci. Technol. 28, 025005–025012 (2013)CrossRefADS
Zurück zum Zitat Lee, H.K., Lee, D.H., Song, Y.M., Lee, Y.T., Yu, J.S.: Thermal measurements and analysis of AlGaInP/GaInP MQW red LEDs with different chip sizes and substrate thicknesses. Solid State Electron. 56, 79–84 (2011)CrossRefADS Lee, H.K., Lee, D.H., Song, Y.M., Lee, Y.T., Yu, J.S.: Thermal measurements and analysis of AlGaInP/GaInP MQW red LEDs with different chip sizes and substrate thicknesses. Solid State Electron. 56, 79–84 (2011)CrossRefADS
Zurück zum Zitat Lu, W., Zhang, T., He, S.M., Zhang, B., Li, N., Liu, S.S.: Light-emitting diodes for space applications. Opt. Quant. Electron. 41, 883–893 (2009)CrossRef Lu, W., Zhang, T., He, S.M., Zhang, B., Li, N., Liu, S.S.: Light-emitting diodes for space applications. Opt. Quant. Electron. 41, 883–893 (2009)CrossRef
Zurück zum Zitat Manik, N.B., Basu, A.N., Mukherjee, S.C.: Characterisation of the photodetector and light emitting diode at above liquid nitrogen temperature. Cryogenics 40, 341–344 (2000)CrossRefADS Manik, N.B., Basu, A.N., Mukherjee, S.C.: Characterisation of the photodetector and light emitting diode at above liquid nitrogen temperature. Cryogenics 40, 341–344 (2000)CrossRefADS
Zurück zum Zitat Tapajna, M., Pjencak, J., Vrbicky, A., Harmatha, L., Kudela, P.: Application of open circuit voltage decay to the characterization of epitaxial layer. J. Electr. Eng. 55, 239–244 (2004) Tapajna, M., Pjencak, J., Vrbicky, A., Harmatha, L., Kudela, P.: Application of open circuit voltage decay to the characterization of epitaxial layer. J. Electr. Eng. 55, 239–244 (2004)
Zurück zum Zitat Vanderdoesdebye, J.A.W., Blok, L.: Room temperature minority carrier lifetime and efficiency of p-type \(\text{ GaAs }_{1-x}\text{ P }_{x}\). J. Lumin. 14, 101–113 (1976) Vanderdoesdebye, J.A.W., Blok, L.: Room temperature minority carrier lifetime and efficiency of p-type \(\text{ GaAs }_{1-x}\text{ P }_{x}\). J. Lumin. 14, 101–113 (1976)
Zurück zum Zitat Weling, G., Xuejiao, J., Fei, Y., Bifeng, C., Wei, G., Ying, L., Weiwei, Y.: Characteristics of high power LEDs at high and low temperature. J. Semicond. 32, 044007–044009 (2011)CrossRefADS Weling, G., Xuejiao, J., Fei, Y., Bifeng, C., Wei, G., Ying, L., Weiwei, Y.: Characteristics of high power LEDs at high and low temperature. J. Semicond. 32, 044007–044009 (2011)CrossRefADS
Zurück zum Zitat Yan, D., Lu, H., Chen, D., Zhang, R., Zheng, Y.: Forward tunneling current in GaN-based blue light-emitting diodes. Appl. Phys. Lett. 96, 083504–083506 (2010)CrossRefADS Yan, D., Lu, H., Chen, D., Zhang, R., Zheng, Y.: Forward tunneling current in GaN-based blue light-emitting diodes. Appl. Phys. Lett. 96, 083504–083506 (2010)CrossRefADS
Zurück zum Zitat Yen, C.H., Liu, Y.J., Yu, K.H., Lin, P.L., Chen, T.P., Chen, L.Y., Tsai, T.H., Huang., N.Y., Lee., C.Y., Liu, C.: On an AlGaInP-based light emitting diode with an Indium–Tin–Oxide (ITO) direct ohmic contact structure. Res. Express@NCKU 23, 1–4 (2013) Yen, C.H., Liu, Y.J., Yu, K.H., Lin, P.L., Chen, T.P., Chen, L.Y., Tsai, T.H., Huang., N.Y., Lee., C.Y., Liu, C.: On an AlGaInP-based light emitting diode with an Indium–Tin–Oxide (ITO) direct ohmic contact structure. Res. Express@NCKU 23, 1–4 (2013)
Metadaten
Titel
Influence of temperature on the performance of high power AlGaInP based red light emitting diode
verfasst von
Pradip Dalapati
Nabin Baran Manik
Asok Nath Basu
Publikationsdatum
01.05.2015
Verlag
Springer US
Erschienen in
Optical and Quantum Electronics / Ausgabe 5/2015
Print ISSN: 0306-8919
Elektronische ISSN: 1572-817X
DOI
https://doi.org/10.1007/s11082-014-9980-5

Weitere Artikel der Ausgabe 5/2015

Optical and Quantum Electronics 5/2015 Zur Ausgabe

Neuer Inhalt