Adhesion Mechanics between Nanoscale Silicon Oxide Tips and Few-Layer Graphene

Finite element method (FEM) simulations of the adhesive contact between a nanoscale tip and a silicon oxide substrate covered with graphene were performed, modelling experimental atomic force microscopy pull-off measurements. Simulations showed a slight increase in the pull-off force as layer number increased. This small enhancement was within reported experimental error, agreeing with the experimental findings of layer-independent adhesion forces. Pull-off forces did not vary with the elastic strain in the system for a given number of layers, but were influenced by the greater adhesive stresses for tip–graphene interaction compared with tip–substrate interactions. FEM simulations were also performed on suspended graphene and showed that the adhesive forces increased slightly beyond one layer of graphene, but then varied little from two to four layers of graphene. The results indicate that while there is some local delamination of the graphene sheets from the substrate, the adhesive stresses between the graphene layers in multilayer graphene effectively prevent out-of-plane mechanical deformation of the graphene layers that could result from tip–graphene interactions. Thus, the increased pull-off forces observed beyond one monolayer results from a change in the amount of material between the tip and substrate, or in this case the number of graphene layers, thus increasing the van der Waals force between tip and graphene.